Issued Patents All Time
Showing 1–25 of 57 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12270774 | System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles | Mark D. DiManna, Jeffrey Sauer, Terry Griffin | 2025-04-08 |
| 12044638 | System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles | Mark D. DiManna, Jeff Sauer, Terry Griffin | 2024-07-23 |
| 10410828 | Charged particle beam system and methods | Chuong Huynh, Bernhard Goetze, Diane K. Stewart | 2019-09-10 |
| 10354830 | Charged particle beam system | Weijie Huang | 2019-07-16 |
| 10037862 | Charged particle detecting device and charged particle beam system with same | Sybren Sijbrandij, Raymond Hill | 2018-07-31 |
| 9640364 | Charged particle beam system and method of operating a charged particle beam system | FHM-Faridur Rahman, Weijie Huang, Shawn McVey | 2017-05-02 |
| 9627172 | Charged particle beam system and method of operating a charged particle beam system | Weijie Huang, FHM-Faridur Rahman, Shawn McVey | 2017-04-18 |
| 9536699 | Charged particle beam system and method of operating a charged particle beam system | Weijie Huang, Raymond Hill, FHM-Faridur Rahman, Alexander Groholski, Shawn McVey | 2017-01-03 |
| 9530611 | Charged particle beam system and method of operating a charged particle beam system | Alexander Groholski, Robert Conners, Mark D. DiManna, Raymond Hill | 2016-12-27 |
| 9530612 | Charged particle beam system and method of operating a charged particle beam system | Mark D. DiManna, Raymond Hill, Robert Conners, Alexander Groholski | 2016-12-27 |
| 9236225 | Ion sources, systems and methods | Billy W. Ward, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger +3 more | 2016-01-12 |
| 9218934 | Charged particle beam system and method of operating a charged particle beam system | Weijie Huang, FHM-Faridur Rahman, Shawn McVey | 2015-12-22 |
| 9218935 | Charged particle beam system and method of operating a charged particle beam system | FHM-Faridur Rahman, Weijie Huang, Shawn McVey | 2015-12-22 |
| 9159527 | Systems and methods for a gas field ionization source | Billy W. Ward, Lou Farkas, Randall G. Percival | 2015-10-13 |
| 9029765 | Ion sources, systems and methods | Richard Comunale, Alexander Groholski, Randall G. Percival, Billy W. Ward | 2015-05-12 |
| 9012867 | Ion sources, systems and methods | Billy W. Ward, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger +3 more | 2015-04-21 |
| 9000396 | Charged particle detectors | Raymond Hill, Shawn McVey | 2015-04-07 |
| 8993981 | Charged particle source with light monitoring for tip temperature determination | Randall G. Percival, Milton Rahman, Louise S. Barriss, Russell Mello, Mark D. DiManna | 2015-03-31 |
| 8907277 | Reducing particle implantation | Rainer Knippelmeyer, Nicholas Economou, Mohan Ananth, Lewis A. Stern, Bill DiNatale +1 more | 2014-12-09 |
| 8766210 | Variable energy charged particle systems | Raymond Hill | 2014-07-01 |
| 8748845 | Ion sources, systems and methods | Billy W. Ward, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger +3 more | 2014-06-10 |
| 8669525 | Sample inspection methods, systems and components | Sybren Sijbrandij, William B. Thompson | 2014-03-11 |
| 8648299 | Isotope ion microscope methods and systems | Sybren Sijbrandij | 2014-02-11 |
| 8633451 | Ion sources, systems and methods | Billy W. Ward, Colin August Sanford, Alexander Groholski, Mark D. DiManna | 2014-01-21 |
| 8563954 | Ion beam stabilization | FHM-Faridur Rahman, Louis S. Farkas, III | 2013-10-22 |