SS

Sybren Sijbrandij

CG Carl Zeiss Microscopy Gmbh: 3 patents #151 of 564Top 30%
CG Carl Zeiss Nts Gmbh: 1 patents #39 of 103Top 40%
FE Fei: 1 patents #375 of 681Top 60%
🗺 Massachusetts: #23,459 of 88,656 inventorsTop 30%
Overall (All Time): #986,976 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
10037862 Charged particle detecting device and charged particle beam system with same John A. Notte, IV, Raymond Hill 2018-07-31
8669525 Sample inspection methods, systems and components John A. Notte, IV, William B. Thompson 2014-03-11
8648299 Isotope ion microscope methods and systems John A. Notte, IV 2014-02-11
8399834 Isotope ion microscope methods and systems John A. Notte, IV 2013-03-19
7727681 Electron beam processing for mask repair Diane K. Stewart, J. David Casey, Jr., John Beaty, Christian R. Musil, Steven Berger 2010-06-01