Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12270774 | System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles | John A. Notte, IV, Mark D. DiManna, Jeffrey Sauer | 2025-04-08 |
| 12044638 | System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles | John A. Notte, IV, Mark D. DiManna, Jeff Sauer | 2024-07-23 |
| 8306750 | Computer-automated spatial analysis | — | 2012-11-06 |