Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378532 | Inspection system and inspection method to qualify semiconductor structures | Brett Lewis, Wilhelm Kuehn, Deying Xia, Ulrich Mantz | 2022-07-05 |
| 9640364 | Charged particle beam system and method of operating a charged particle beam system | John A. Notte, IV, FHM-Faridur Rahman, Weijie Huang | 2017-05-02 |
| 9627172 | Charged particle beam system and method of operating a charged particle beam system | John A. Notte, IV, Weijie Huang, FHM-Faridur Rahman | 2017-04-18 |
| 9536699 | Charged particle beam system and method of operating a charged particle beam system | John A. Notte, IV, Weijie Huang, Raymond Hill, FHM-Faridur Rahman, Alexander Groholski | 2017-01-03 |
| 9218935 | Charged particle beam system and method of operating a charged particle beam system | John A. Notte, IV, FHM-Faridur Rahman, Weijie Huang | 2015-12-22 |
| 9218934 | Charged particle beam system and method of operating a charged particle beam system | John A. Notte, IV, Weijie Huang, FHM-Faridur Rahman | 2015-12-22 |
| 9000396 | Charged particle detectors | Raymond Hill, John A. Notte, IV | 2015-04-07 |
| 7521693 | Ion sources, systems and methods | Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill +1 more | 2009-04-21 |