WK

Wilhelm Kuehn

CG Carl Zeiss Microscopy Gmbh: 1 patents #298 of 564Top 55%
CG Carl Zeiss Smt Gmbh: 1 patents #657 of 1,189Top 60%
📍 Königsbronn, DE: #34 of 57 inventorsTop 60%
Overall (All Time): #2,665,284 of 4,157,543Top 65%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11378532 Inspection system and inspection method to qualify semiconductor structures Brett Lewis, Deying Xia, Shawn McVey, Ulrich Mantz 2022-07-05