Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12176179 | Method, device and system for reducing off-axial aberration in electron microscopy | Peter Christiaan Tiemeijer, Tjerk G. Spanjer, Stan Johan Pieter Konings | 2024-12-24 |
| 11817290 | Method, device and system for reducing off-axial aberration in electron microscopy | Peter Christiaan Tiemeijer, Tjerk G. Spanjer, Stan Johan Pieter Konings | 2023-11-14 |
| 11587759 | Method, device and system for reducing off-axial aberration in electron microscopy | Peter Christiaan Tiemeijer, Tjerk G. Spanjer, Stan Johan Pieter Konings | 2023-02-21 |
| 10224174 | Transmission charged particle microscope with imaging beam rotation | Bert Henning Freitag, Peter Christiaan Tiemeijer | 2019-03-05 |
| 9029767 | Method for adjusting a stem equipped with an aberration corrector | Bernd Rieger | 2015-05-12 |
| 8569693 | Distortion free stigmation of a TEM | Alexander Henstra, Uwe Luecken, Peter Christiaan Tiemeijer | 2013-10-29 |