Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12327342 | Automatic particle beam focusing | Yuchen Deng, Bart van Knippenberg, Holger Kohr | 2025-06-10 |
| 12074007 | Rotating sample holder for random angle sampling in tomography | Bart Jozef Janssen, Edwin Verschueren | 2024-08-27 |
| 11990315 | Measurement and correction of optical aberrations in charged particle beam microscopy | Bart Jozef Janssen | 2024-05-21 |
| 11887809 | Auto-tuning stage settling time with feedback in charged particle microscopy | Yuchen Deng, Bart van Knippenberg, Holger Kohr | 2024-01-30 |
| 11799486 | Systems and methods for quantum computing based sample analysis | Valentina Caprara Vivoli, Yuchen Deng | 2023-10-24 |
| 11756762 | Rotating sample holder for random angle sampling in tomography | Bart Jozef Janssen, Edwin Verschueren | 2023-09-12 |
| 11742175 | Defective pixel management in charged particle microscopy | Bart Jozef Janssen | 2023-08-29 |
| 11501197 | Systems and methods for quantum computing based sample analysis | Valentina Caprara Vivoli, Yuchen Deng | 2022-11-15 |
| 11257656 | Rotating sample holder for random angle sampling in tomography | Bart Jozef Janssen, Edwin Verschueren | 2022-02-22 |
| 11151356 | Using convolution neural networks for on-the-fly single particle reconstruction | John Flanagan, Maurice Peemen | 2021-10-19 |
| 10937625 | Method of imaging a sample using an electron microscope | Remco Schoenmakers, Bart Jozef Janssen, Martin Verheijen, Holger Kohr, Yuchen Deng +1 more | 2021-03-02 |
| 10825647 | Innovative imaging technique in transmission charged particle microscopy | Bart Jozef Janssen, Lingbo Yu | 2020-11-03 |
| 10665419 | Intelligent pre-scan in scanning transmission charged particle microscopy | Ivan Lazic, Bart Jozef Janssen | 2020-05-26 |
| 10389955 | Method for detecting particulate radiation | Bart Jozef Janssen, Maarten Kuijper, Lingbo Yu | 2019-08-20 |
| 10122946 | Method for detecting particulate radiation | Bart Jozef Janssen, Maarten Kuijper, Lingbo Yu | 2018-11-06 |
| 8912491 | Method of performing tomographic imaging of a sample in a charged-particle microscope | Remco Schoenmakers, Uwe Luecken | 2014-12-16 |