Erik Franken — 16 Patents at Fei

Erik Franken has been granted 16 US patents while listed as an inventor at Fei. The first was granted in 2014 and the most recent in June 2025. Erik Franken ranks #284,196 of 4,157,543 US inventors in our database (top 6.8%). Patent records list Erik Franken in Nuenen, NL.

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12327342	Automatic particle beam focusing	Yuchen Deng, Bart van Knippenberg, Holger Kohr	2025-06-10
12074007	Rotating sample holder for random angle sampling in tomography	Bart Jozef Janssen, Edwin Verschueren	2024-08-27
11990315	Measurement and correction of optical aberrations in charged particle beam microscopy	Bart Jozef Janssen	2024-05-21
11887809	Auto-tuning stage settling time with feedback in charged particle microscopy	Yuchen Deng, Bart van Knippenberg, Holger Kohr	2024-01-30
11799486	Systems and methods for quantum computing based sample analysis	Valentina Caprara Vivoli, Yuchen Deng	2023-10-24
11756762	Rotating sample holder for random angle sampling in tomography	Bart Jozef Janssen, Edwin Verschueren	2023-09-12
11742175	Defective pixel management in charged particle microscopy	Bart Jozef Janssen	2023-08-29
11501197	Systems and methods for quantum computing based sample analysis	Valentina Caprara Vivoli, Yuchen Deng	2022-11-15
11257656	Rotating sample holder for random angle sampling in tomography	Bart Jozef Janssen, Edwin Verschueren	2022-02-22
11151356	Using convolution neural networks for on-the-fly single particle reconstruction	John Flanagan, Maurice Peemen	2021-10-19
10937625	Method of imaging a sample using an electron microscope	Remco Schoenmakers, Bart Jozef Janssen, Martin Verheijen, Holger Kohr, Yuchen Deng +1 more	2021-03-02
10825647	Innovative imaging technique in transmission charged particle microscopy	Bart Jozef Janssen, Lingbo Yu	2020-11-03
10665419	Intelligent pre-scan in scanning transmission charged particle microscopy	Ivan Lazic, Bart Jozef Janssen	2020-05-26
10389955	Method for detecting particulate radiation	Bart Jozef Janssen, Maarten Kuijper, Lingbo Yu	2019-08-20	$3,845,000
10122946	Method for detecting particulate radiation	Bart Jozef Janssen, Maarten Kuijper, Lingbo Yu	2018-11-06
8912491	Method of performing tomographic imaging of a sample in a charged-particle microscope	Remco Schoenmakers, Uwe Luecken	2014-12-16	$6,985,000

Erik Franken — 16 Patents

Issued Patents All Time

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