Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Systems and methods for quantum computing based sample analysis

Systems and methods for quantum computing based sample analysis

US Patent 11799486 · Granted Oct 24, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Area selection in charged particle microscope imaging2025
Automatic particle beam focusing2025
Automatic particle beam focusing2025
Bifocal electron microscope2025
Rotating sample holder for random angle sampling in tomography2024
Measurement and correction of optical aberrations in charged particle beam micro2024
Electron diffraction holography2024
Auto-tuning stage settling time with feedback in charged particle microscopy2024
Auto-tuning stage settling time with feedback in charged particle microscopy2024
Rotating sample holder for random angle sampling in tomography2023
Defective pixel management in charged particle microscopy2023
System and method for reducing the charging effect in a transmission electron mi2023