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Area selection in charged particle microscope imaging |
Holger Kohr, Maurice Peemen |
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Automatic particle beam focusing |
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2025-06-10 |
| 12216068 |
Bifocal electron microscope |
Alexander Henstra, Holger Kohr |
2025-02-04 |
| 11906450 |
Electron diffraction holography |
Alexander Henstra, Holger Kohr |
2024-02-20 |
| 11887809 |
Auto-tuning stage settling time with feedback in charged particle microscopy |
Erik Franken, Bart van Knippenberg, Holger Kohr |
2024-01-30 |
| 11799486 |
Systems and methods for quantum computing based sample analysis |
Valentina Caprara Vivoli, Erik Franken |
2023-10-24 |
| 11715618 |
System and method for reducing the charging effect in a transmission electron microscope system |
Alexander Henstra, Peter Christiaan Tiemeijer |
2023-08-01 |
| 11501197 |
Systems and methods for quantum computing based sample analysis |
Valentina Caprara Vivoli, Erik Franken |
2022-11-15 |
| 11460419 |
Electron diffraction holography |
Alexander Henstra, Holger Kohr |
2022-10-04 |
| 11456149 |
Methods and systems for acquiring 3D diffraction data |
Bart Buijsse, Alexander Henstra |
2022-09-27 |
| 11404241 |
Simultaneous TEM and STEM microscope |
Alexander Henstra, Holger Kohr |
2022-08-02 |
| 11183364 |
Dual beam microscope system for imaging during sample processing |
Petrus Hubertus Franciscus Trompenaars, Bart Buijsse, Alexander Henstra |
2021-11-23 |
| 10937625 |
Method of imaging a sample using an electron microscope |
Erik Franken, Remco Schoenmakers, Bart Jozef Janssen, Martin Verheijen, Holger Kohr +1 more |
2021-03-02 |
| 10923308 |
Method and system for energy resolved chroma imaging |
Peter Christiaan Tiemeijer, Holger Kohr, Jaydeep Sanjay Belapure |
2021-02-16 |