Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347083 | Area selection in charged particle microscope imaging | Holger Kohr, Maurice Peemen | 2025-07-01 |
| 12327342 | Automatic particle beam focusing | Erik Franken, Bart van Knippenberg, Holger Kohr | 2025-06-10 |
| 12216068 | Bifocal electron microscope | Alexander Henstra, Holger Kohr | 2025-02-04 |
| 11906450 | Electron diffraction holography | Alexander Henstra, Holger Kohr | 2024-02-20 |
| 11887809 | Auto-tuning stage settling time with feedback in charged particle microscopy | Erik Franken, Bart van Knippenberg, Holger Kohr | 2024-01-30 |
| 11799486 | Systems and methods for quantum computing based sample analysis | Valentina Caprara Vivoli, Erik Franken | 2023-10-24 |
| 11715618 | System and method for reducing the charging effect in a transmission electron microscope system | Alexander Henstra, Peter Christiaan Tiemeijer | 2023-08-01 |
| 11501197 | Systems and methods for quantum computing based sample analysis | Valentina Caprara Vivoli, Erik Franken | 2022-11-15 |
| 11460419 | Electron diffraction holography | Alexander Henstra, Holger Kohr | 2022-10-04 |
| 11456149 | Methods and systems for acquiring 3D diffraction data | Bart Buijsse, Alexander Henstra | 2022-09-27 |
| 11404241 | Simultaneous TEM and STEM microscope | Alexander Henstra, Holger Kohr | 2022-08-02 |
| 11183364 | Dual beam microscope system for imaging during sample processing | Petrus Hubertus Franciscus Trompenaars, Bart Buijsse, Alexander Henstra | 2021-11-23 |
| 10937625 | Method of imaging a sample using an electron microscope | Erik Franken, Remco Schoenmakers, Bart Jozef Janssen, Martin Verheijen, Holger Kohr +1 more | 2021-03-02 |
| 10923308 | Method and system for energy resolved chroma imaging | Peter Christiaan Tiemeijer, Holger Kohr, Jaydeep Sanjay Belapure | 2021-02-16 |