Remco Schoenmakers — 17 Patents at Fei

Remco Schoenmakers has been granted 17 US patents while listed as an inventor at Fei. The first was granted in 2012 and the most recent in December 2024. Remco Schoenmakers ranks #263,971 of 4,157,543 US inventors in our database (top 6.3%). Patent records list Remco Schoenmakers in Best, NL.

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12175648	Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method	Maurice Peemen, Pavel Potocek	2024-12-24
12136532	Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging	Pavel Potocek, Maurice Peemen, Bert Henning Freitag	2024-11-05
11901155	Method of aligning a charged particle beam apparatus	Mykola Kaplenko, Oleksii Kaplenko, Ondrej Machek	2024-02-13
11861817	Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method	Maurice Peemen, Pavel Poto{hacek over (c)}ek	2024-01-02
11488800	Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging	Pavel Potocek, Maurice Peemen, Bert Henning Freitag	2022-11-01
11482400	Method, device and system for remote deep learning for microscopic image reconstruction and segmentation	Maurice PEEMAN, Faysal Boughorbel, Pavel Potocek	2022-10-25
11417497	Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquired	Jaydeep Sanjay Belapure	2022-08-16
11100612	Acquisition strategy for neural network based image restoration	Maurice Peemen, Pavel Poto{hacek over (c)}ek	2021-08-24
10937625	Method of imaging a sample using an electron microscope	Erik Franken, Bart Jozef Janssen, Martin Verheijen, Holger Kohr, Yuchen Deng +1 more	2021-03-02
10903043	Method, device and system for remote deep learning for microscopic image reconstruction and segmentation	Maurice Peemen, Faysal Boughorbel, Pavel Potocek	2021-01-26
10593068	Tomographic imaging method	Pavel Poto{hacek over (c)}ek	2020-03-17
10481378	Interactive graphical representation of image quality and control thereof	Pavel Poto{hacek over (c)}ek	2019-11-19	$3,274,000
9934936	Charged particle microscope with special aperture plate	Pavel Potocek, Franciscus Martinus Henricus Maria van Laarhoven, Faysal Boughorbel, Peter Christiaan Tiemeijer	2018-04-03
9618460	Method of performing tomographic imaging of a sample in a charged-particle microscope	David Foord	2017-04-11
9147551	Method for electron tomography	Uwe Luecken, Johannes Antonius Maria van den Oetelaar	2015-09-29	$14,995,000
8912491	Method of performing tomographic imaging of a sample in a charged-particle microscope	Uwe Luecken, Erik Franken	2014-12-16	$6,985,000
8338782	Detector system for transmission electron microscope	Uwe Luecken, Frank Jeroen Pieter Schuurmans	2012-12-25

Remco Schoenmakers — 17 Patents

Issued Patents All Time

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