Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175648 | Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method | Maurice Peemen, Pavel Potocek | 2024-12-24 |
| 12136532 | Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging | Pavel Potocek, Maurice Peemen, Bert Henning Freitag | 2024-11-05 |
| 11901155 | Method of aligning a charged particle beam apparatus | Mykola Kaplenko, Oleksii Kaplenko, Ondrej Machek | 2024-02-13 |
| 11861817 | Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method | Maurice Peemen, Pavel Poto{hacek over (c)}ek | 2024-01-02 |
| 11488800 | Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging | Pavel Potocek, Maurice Peemen, Bert Henning Freitag | 2022-11-01 |
| 11482400 | Method, device and system for remote deep learning for microscopic image reconstruction and segmentation | Maurice PEEMAN, Faysal Boughorbel, Pavel Potocek | 2022-10-25 |
| 11417497 | Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquired | Jaydeep Sanjay Belapure | 2022-08-16 |
| 11100612 | Acquisition strategy for neural network based image restoration | Maurice Peemen, Pavel Poto{hacek over (c)}ek | 2021-08-24 |
| 10937625 | Method of imaging a sample using an electron microscope | Erik Franken, Bart Jozef Janssen, Martin Verheijen, Holger Kohr, Yuchen Deng +1 more | 2021-03-02 |
| 10903043 | Method, device and system for remote deep learning for microscopic image reconstruction and segmentation | Maurice Peemen, Faysal Boughorbel, Pavel Potocek | 2021-01-26 |
| 10593068 | Tomographic imaging method | Pavel Poto{hacek over (c)}ek | 2020-03-17 |
| 10481378 | Interactive graphical representation of image quality and control thereof | Pavel Poto{hacek over (c)}ek | 2019-11-19 |
| 9934936 | Charged particle microscope with special aperture plate | Pavel Potocek, Franciscus Martinus Henricus Maria van Laarhoven, Faysal Boughorbel, Peter Christiaan Tiemeijer | 2018-04-03 |
| 9618460 | Method of performing tomographic imaging of a sample in a charged-particle microscope | David Foord | 2017-04-11 |
| 9147551 | Method for electron tomography | Uwe Luecken, Johannes Antonius Maria van den Oetelaar | 2015-09-29 |
| 8912491 | Method of performing tomographic imaging of a sample in a charged-particle microscope | Uwe Luecken, Erik Franken | 2014-12-16 |
| 8338782 | Detector system for transmission electron microscope | Uwe Luecken, Frank Jeroen Pieter Schuurmans | 2012-12-25 |