RS

Remco Schoenmakers

FE Fei: 15 patents #29 of 681Top 5%
Overall (All Time): #266,722 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12175648 Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method Maurice Peemen, Pavel Potocek 2024-12-24
12136532 Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging Pavel Potocek, Maurice Peemen, Bert Henning Freitag 2024-11-05
11901155 Method of aligning a charged particle beam apparatus Mykola Kaplenko, Oleksii Kaplenko, Ondrej Machek 2024-02-13
11861817 Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method Maurice Peemen, Pavel Poto{hacek over (c)}ek 2024-01-02
11488800 Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging Pavel Potocek, Maurice Peemen, Bert Henning Freitag 2022-11-01
11482400 Method, device and system for remote deep learning for microscopic image reconstruction and segmentation Maurice PEEMAN, Faysal Boughorbel, Pavel Potocek 2022-10-25
11417497 Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquired Jaydeep Sanjay Belapure 2022-08-16
11100612 Acquisition strategy for neural network based image restoration Maurice Peemen, Pavel Poto{hacek over (c)}ek 2021-08-24
10937625 Method of imaging a sample using an electron microscope Erik Franken, Bart Jozef Janssen, Martin Verheijen, Holger Kohr, Yuchen Deng +1 more 2021-03-02
10903043 Method, device and system for remote deep learning for microscopic image reconstruction and segmentation Maurice Peemen, Faysal Boughorbel, Pavel Potocek 2021-01-26
10593068 Tomographic imaging method Pavel Poto{hacek over (c)}ek 2020-03-17
10481378 Interactive graphical representation of image quality and control thereof Pavel Poto{hacek over (c)}ek 2019-11-19
9934936 Charged particle microscope with special aperture plate Pavel Potocek, Franciscus Martinus Henricus Maria van Laarhoven, Faysal Boughorbel, Peter Christiaan Tiemeijer 2018-04-03
9618460 Method of performing tomographic imaging of a sample in a charged-particle microscope David Foord 2017-04-11
9147551 Method for electron tomography Uwe Luecken, Johannes Antonius Maria van den Oetelaar 2015-09-29
8912491 Method of performing tomographic imaging of a sample in a charged-particle microscope Uwe Luecken, Erik Franken 2014-12-16
8338782 Detector system for transmission electron microscope Uwe Luecken, Frank Jeroen Pieter Schuurmans 2012-12-25