OM

Ondrej Machek

FE Fei: 4 patents #139 of 681Top 25%
Overall (All Time): #1,070,729 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12223752 Data acquisition in charged particle microscopy Pavel Potocek, Tereza Konečná 2025-02-11
12211666 Data acquisition and processing techniques for three-dimensional reconstruction Oleksii Kaplenko, Tomas Vystavel, Petr Wandrol 2025-01-28
11901155 Method of aligning a charged particle beam apparatus Mykola Kaplenko, Remco Schoenmakers, Oleksii Kaplenko 2024-02-13
11355305 Low keV ion beam image restoration by machine learning for object localization Remco Johannes Petrus Geurts, Pavel Potocek, Maurice Peemen 2022-06-07