John Flanagan — 7 Patents at Fei

John Flanagan has been granted 7 US patents while listed as an inventor at Fei. The first was granted in 2018 and the most recent in July 2025. John Flanagan ranks #680,018 of 4,157,543 US inventors in our database (top 16.4%). Patent records list John Flanagan in Hillsboro, OR, US.

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #	Title	Co-Inventors	Date
12362137	Automated sample alignment for microscopy	Michael Strauss	2025-07-15
12293525	Artificial intelligence enabled metrology	Brad Larson, Thomas G. Miller	2025-05-06
11847813	Artificial intelligence-enabled preparation end-pointing	Thomas G. Miller, Brian Roberts Routh, Jr., Richard Young, Brad Larson, Aditee Shrotre	2023-12-19
11569056	Parameter estimation for metrology of features in an image	Brad Larson, Maurice Peemen	2023-01-31
11176656	Artificial intelligence-enabled preparation end-pointing	Thomas G. Miller, Brian Roberts Routh, Jr., Richard Young, Brad Larson, Aditee Shrotre	2021-11-16
11151356	Using convolution neural networks for on-the-fly single particle reconstruction	Erik Franken, Maurice Peemen	2021-10-19
9978557	System for orienting a sample using a diffraction pattern	—	2018-05-22

John Flanagan — 7 Patents

Issued Patents All Time

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