Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362137 | Automated sample alignment for microscopy | Michael Strauss | 2025-07-15 |
| 12293525 | Artificial intelligence enabled metrology | Brad Larson, Thomas G. Miller | 2025-05-06 |
| 11847813 | Artificial intelligence-enabled preparation end-pointing | Thomas G. Miller, Brian Roberts Routh, Jr., Richard Young, Brad Larson, Aditee Shrotre | 2023-12-19 |
| 11569056 | Parameter estimation for metrology of features in an image | Brad Larson, Maurice Peemen | 2023-01-31 |
| 11176656 | Artificial intelligence-enabled preparation end-pointing | Thomas G. Miller, Brian Roberts Routh, Jr., Richard Young, Brad Larson, Aditee Shrotre | 2021-11-16 |
| 11151356 | Using convolution neural networks for on-the-fly single particle reconstruction | Erik Franken, Maurice Peemen | 2021-10-19 |
| 9978557 | System for orienting a sample using a diffraction pattern | — | 2018-05-22 |