Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12293525 | Artificial intelligence enabled metrology | John Flanagan, Thomas G. Miller | 2025-05-06 |
| 11847813 | Artificial intelligence-enabled preparation end-pointing | Thomas G. Miller, John Flanagan, Brian Roberts Routh, Jr., Richard Young, Aditee Shrotre | 2023-12-19 |
| 11569056 | Parameter estimation for metrology of features in an image | John Flanagan, Maurice Peemen | 2023-01-31 |
| 11355313 | Line-based endpoint detection | Brian Roberts Routh, Jr., Aditee Shrotre, Oleg Sidorov | 2022-06-07 |
| 11176656 | Artificial intelligence-enabled preparation end-pointing | Thomas G. Miller, John Flanagan, Brian Roberts Routh, Jr., Richard Young, Aditee Shrotre | 2021-11-16 |
| 10614998 | Charge reduction by digital image correlation | Remco Johannes Petrus Geurts, Pavel Potocek | 2020-04-07 |
| 10534284 | Exposure adjustment factor | Mark Hirst, Mark Shaw | 2020-01-14 |
| 7656429 | Digital camera and method for in creating still panoramas and composite photographs | — | 2010-02-02 |
| 7251061 | Resolution enhancement apparatus, systems, and methods | Eugene A. Roylance | 2007-07-31 |