| 12249482 |
Microscopy feedback for improved milling accuracy |
Thomas G. Miller, Jason Arjavac, Mark Biedrzycki |
2025-03-11 |
| 11847813 |
Artificial intelligence-enabled preparation end-pointing |
Thomas G. Miller, John Flanagan, Richard Young, Brad Larson, Aditee Shrotre |
2023-12-19 |
| 11798804 |
Method of material deposition |
Thomas G. Miller, Chad Rue, Noel Thomas Franco |
2023-10-24 |
| 11355313 |
Line-based endpoint detection |
Brad Larson, Aditee Shrotre, Oleg Sidorov |
2022-06-07 |
| 11176656 |
Artificial intelligence-enabled preparation end-pointing |
Thomas G. Miller, John Flanagan, Richard Young, Brad Larson, Aditee Shrotre |
2021-11-16 |
| 11069509 |
Method and system for backside planar view lamella preparation |
James Clarke, Micah LeDoux, Cliff Bugge |
2021-07-20 |
| 11069523 |
Method of material deposition |
Thomas G. Miller, Chad Rue, Noel Thomas Franco |
2021-07-20 |
| 10825651 |
Automated TEM sample preparation |
Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard Young +3 more |
2020-11-03 |
| 10340119 |
Automated TEM sample preparation |
Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard Young +3 more |
2019-07-02 |
| 10068749 |
Preparation of lamellae for TEM viewing |
Scott Edward Fuller, Michael Moriarty |
2018-09-04 |
| 9978586 |
Method of material deposition |
Thomas G. Miller, Chad Rue, Noel Thomas Franco |
2018-05-22 |
| 9601313 |
Automated TEM sample preparation |
Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard Young +3 more |
2017-03-21 |
| 9601312 |
Source for selectively providing positively or negatively charged particles for a focusing column |
— |
2017-03-21 |
| 9281163 |
High capacity TEM grid |
Valerie Brogden, Michael Schmidt |
2016-03-08 |
| 9275828 |
Source for selectively providing positively or negatively charged particles for a focusing column |
— |
2016-03-01 |
| 8766214 |
Method of preparing and imaging a lamella in a particle-optical apparatus |
Peter Christiaan Tiemeijer, Bart Jozef Janssen, Thomas G. Miller, David Foord, Ivan Lazic |
2014-07-01 |
| 8716673 |
Inductively coupled plasma source as an electron beam source for spectroscopic analysis |
— |
2014-05-06 |