| 12488957 |
Crenellated sample holder and sputter target for sample preparation in cryo electron microscopy applications |
— |
2025-12-02 |
|
| 11798804 |
Method of material deposition |
Brian Roberts Routh, Jr., Thomas G. Miller, Noel Thomas Franco |
2023-10-24 |
|
| 11735404 |
Method, device and system for the treatment of biological cryogenic samples by plasma focused ion beams |
Alex DE MARCO, Sergey Gorelick, Joseph Christian, Kenny Mani, Steven Randolph +1 more |
2023-08-22 |
|
| 11651924 |
Method of producing microrods for electron emitters, and associated microrods and electron emitters |
Kun Liu, Alan Bahm |
2023-05-16 |
|
| 11069523 |
Method of material deposition |
Brian Roberts Routh, Jr., Thomas G. Miller, Noel Thomas Franco |
2021-07-20 |
|
| 11062879 |
Face-on, gas-assisted etching for plan-view lamellae preparation |
Noel Thomas Franco, Kenny Mani, Joe Christian, Jeffrey Blackwood |
2021-07-13 |
|
| 10930514 |
Method and apparatus for the planarization of surfaces |
Philip Brundage, Zachary Klassen |
2021-02-23 |
|
| 10546719 |
Face-on, gas-assisted etching for plan-view lamellae preparation |
Noel Thomas Franco, Kenny Mani, Joe Christian, Jeffrey Blackwood |
2020-01-28 |
|
| 10347463 |
Enhanced charged particle beam processes for carbon removal |
Joe Christian, Kenny Mani, Noel Thomas Franco |
2019-07-09 |
|
| 10325754 |
Ion implantation to alter etch rate |
David Foord |
2019-06-18 |
|
| 10190953 |
Tomography sample preparation systems and methods with improved speed, automation, and reliability |
Guillaume Delpy, Guillaume Audoit, Laurens Franz Taemsz Kwakman, Jorge Filevich |
2019-01-29 |
|
| 9983152 |
Material characterization using ion channeling imaging |
Steven Randolph |
2018-05-29 |
|
| 9978586 |
Method of material deposition |
Brian Roberts Routh, Jr., Thomas G. Miller, Noel Thomas Franco |
2018-05-22 |
|
| 9761467 |
Gas injection system with precursor for planar deprocessing of semiconductor devices using a focused ion beam |
Clive D. Chandler |
2017-09-12 |
|
| 9443697 |
Low energy ion beam etch |
— |
2016-09-13 |
$13,651,000 |
| 9087366 |
High accuracy beam placement for local area navigation |
Richard Young, Peter D. Carleson, Reinier Louis Warschauer |
2015-07-21 |
$4,531,000 |
| 9064811 |
Precursor for planar deprocessing of semiconductor devices using a focused ion beam |
Clive D. Chandler |
2015-06-23 |
$18,800,000 |
| 8781219 |
High accuracy beam placement for local area navigation |
Reinier Louis Warschauer, Richard Young, Peter D. Carleson |
2014-07-15 |
$4,468,000 |
| 8610092 |
Charged particle beam processing system with visual and infrared imaging |
Enrique Agorio |
2013-12-17 |
$14,080,000 |
| 8455822 |
Navigation and sample processing using an ion source containing both low-mass and high-mass species |
— |
2013-06-04 |
$8,103,000 |
| 8358832 |
High accuracy beam placement for local area navigation |
Richard Young, Peter D. Carleson |
2013-01-22 |
$5,088,000 |
| 8059918 |
High accuracy beam placement for local area navigation |
Richard Young, Peter D. Carleson |
2011-11-15 |
$12,470,000 |
| 7781733 |
In-situ high-resolution light-optical channel for optical viewing and surface processing in parallel with charged particle (FIB and SEM) techniques |
Steven B. Herschbein, Herschel M. Marchman, Narender Rana |
2010-08-24 |
$3,306,000 |
| 7351966 |
High-resolution optical channel for non-destructive navigation and processing of integrated circuits |
Herschel M. Marchman, Steven B. Herschbein, Michael Renner, Narender Rana |
2008-04-01 |
$7,825,000 |
| 7119333 |
Ion detector for ion beam applications |
Steven B. Herschbein, Narender Rana, Michael Sievers |
2006-10-10 |
$5,276,000 |
