EA

Enrique Agorio

FE Fei: 5 patents #114 of 681Top 20%
Applied Materials: 1 patents #4,780 of 7,310Top 70%
Overall (All Time): #849,052 of 4,157,543Top 25%
6
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9349570 Method and apparatus for sample extraction and handling James E. Hudson, Gerhard Daniel, Michael Tanguay, Jason Arjavac 2016-05-24
8993962 Method and apparatus for sample extraction and handling James E. Hudson, Gerhard Daniel, Michael Tanguay, Jason Arjavac 2015-03-31
8610092 Charged particle beam processing system with visual and infrared imaging Chad Rue 2013-12-17
8357913 Method and apparatus for sample extraction and handling James E. Hudson, Michael Tanguay, Jason Arjavac, Gerhard Daniel 2013-01-22
7511282 Sample preparation Michael Tanguay, Christophe Roudin, Liang Hong, Jay Jordan, Craig Henry +1 more 2009-03-31
6697096 Laser beam pattern generator having rotating scanner compensator and method 2004-02-24