Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9349570 | Method and apparatus for sample extraction and handling | Enrique Agorio, Gerhard Daniel, Michael Tanguay, Jason Arjavac | 2016-05-24 |
| 8993962 | Method and apparatus for sample extraction and handling | Enrique Agorio, Gerhard Daniel, Michael Tanguay, Jason Arjavac | 2015-03-31 |
| 8357913 | Method and apparatus for sample extraction and handling | Enrique Agorio, Michael Tanguay, Jason Arjavac, Gerhard Daniel | 2013-01-22 |
| 8249828 | Defect analyzer | Janet Teshima, Daniel E. Partin | 2012-08-21 |
| 7987072 | Defect analyzer | Janet Teshima, Daniel E. Partin | 2011-07-26 |
| 7474986 | Defect analyzer | Janet Teshima, Daniel E. Partin | 2009-01-06 |
| 7103505 | Defect analyzer | Janet Teshima, Daniel E. Partin | 2006-09-05 |