DP

Daniel E. Partin

FE Fei: 4 patents #139 of 681Top 25%
Overall (All Time): #1,234,570 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8249828 Defect analyzer Janet Teshima, James E. Hudson 2012-08-21
7987072 Defect analyzer Janet Teshima, James E. Hudson 2011-07-26
7474986 Defect analyzer Janet Teshima, James E. Hudson 2009-01-06
7103505 Defect analyzer Janet Teshima, James E. Hudson 2006-09-05