JT

Janet Teshima

FE Fei: 4 patents #139 of 681Top 25%
Overall (All Time): #987,568 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10068782 Device and method for scribing a bottom-side of a substrate while viewing the top side Efrat Moyal 2018-09-04
8249828 Defect analyzer Daniel E. Partin, James E. Hudson 2012-08-21
7987072 Defect analyzer Daniel E. Partin, James E. Hudson 2011-07-26
7474986 Defect analyzer Daniel E. Partin, James E. Hudson 2009-01-06
7103505 Defect analyzer Daniel E. Partin, James E. Hudson 2006-09-05