PB

Philip Brundage

FE Fei: 3 patents #184 of 681Top 30%
Overall (All Time): #1,399,301 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11749496 Protective shutter for charged particle microscope 2023-09-05
10930514 Method and apparatus for the planarization of surfaces Zachary Klassen, Chad Rue 2021-02-23
9709600 Circuit probe for charged particle beam system Paul Johannes L. Barends, Mathijs P. W. van den Boogaard 2017-07-18