Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513079 | Method and system for wafer defect inspection | Roger Alvis, John Fretwell, Tomas Vystavel | 2022-11-29 |
| 10366860 | High aspect ratio X-ray targets and uses of same | N. William Parker, Mark W. Utlaut, Thomas G. Miller | 2019-07-30 |
| 10190953 | Tomography sample preparation systems and methods with improved speed, automation, and reliability | Guillaume Delpy, Guillaume Audoit, Chad Rue, Jorge Filevich | 2019-01-29 |
| 9934930 | High aspect ratio x-ray targets and uses of same | N. William Parker, Mark W. Utlaut, Thomas G. Miller | 2018-04-03 |
| 8757873 | Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus | Stephanus Hubertus Leonardus van den Boom, Pleun Dona, Uwe Luecken, Hervé-William Rémigy, Hendrik Nicolaas Slingerland +2 more | 2014-06-24 |
| 6646263 | Method of X-ray analysis in a particle-optical apparatus | Kars Z. Troost | 2003-11-11 |
| 5354433 | Method for producing a flow of triisobutylaluminum from liquid triisobutylaluminum containing isobutene | Ernst H. A. Granneman, Hans W. Piekaar, Boudewijn G. Sluijk | 1994-10-11 |