Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513079 | Method and system for wafer defect inspection | John Fretwell, Laurens Franz Taemsz Kwakman, Tomas Vystavel | 2022-11-29 |
| 11004651 | Tomography-assisted TEM prep with requested intervention automation workflow | Trevan Landin, Greg Clark | 2021-05-11 |
| 10453646 | Tomography-assisted TEM prep with requested intervention automation workflow | Trevan Landin, Greg Clark | 2019-10-22 |
| 9797923 | Fabrication of a malleable lamella for correlative atomic-resolution tomographic analyses | — | 2017-10-24 |
| 6455385 | Semiconductor fabrication with multiple low dose implant | Emi Ishida | 2002-09-24 |
| 6427345 | Method and apparatus for a line based, two-dimensional characterization of a three-dimensional surface | — | 2002-08-06 |
| 6293698 | Method for precise temperature sensing and control of semiconductor structures | — | 2001-09-25 |
| 5935867 | Shallow drain extension formation by angled implantation | Scott Luning, Peter Griffin | 1999-08-10 |
| 5918149 | Deposition of a conductor in a via hole or trench | Paul R. Besser, John A. Iacoponi | 1999-06-29 |
| 5864199 | Electron beam emitting tungsten filament | Janice Gray, Bryan Tracy | 1999-01-26 |
| 5727978 | Method of forming electron beam emitting tungsten filament | Janice Gray, Bryan Tracy | 1998-03-17 |
| 5713667 | Temperature sensing probe for microthermometry | Andrew Norman Erickson, Ayesha R. Raheem Kizchery, Jeremias D. Romero, Bryan Tracy | 1998-02-03 |
| 5710052 | Scanning spreading resistance probe | Andrew Norman Erickson | 1998-01-20 |
| 5707484 | Method of accurate compositional analysis of dielectric films on semiconductors | Jeremias D. Romero, Homi Fatemi | 1998-01-13 |
| 5650343 | Self-aligned implant energy modulation for shallow source drain extension formation | Scott Luning | 1997-07-22 |
| 5536940 | Energy filtering for electron back-scattered diffraction patterns | David J. Dingley | 1996-07-16 |