Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6812049 | Method and system for performing failure analysis on a multilayer silicon-on-insulator (SOI) device | — | 2004-11-02 |
| 6770512 | Method and system for using TMAH for staining copper silicon on insulator semiconductor device cross sections | Mehrdad Mahanpour, Mohammad Masoodi | 2004-08-03 |
| 6534869 | Method for reducing stress-induced voids for 0.25 &mgr;m micron and smaller semiconductor chip technology by annealing interconnect lines prior to ILD deposition and semiconductor chip made thereby | Paul R. Besser, Minh Van Ngo | 2003-03-18 |
| 6011619 | Semiconductor wafer optical scanning system and method using swath-area defect limitation | Paul J. Steffan, Ming Chen | 2000-01-04 |
| 5882738 | Apparatus and method to improve electromigration performance by use of amorphous barrier layer | Richard C. Blish, II | 1999-03-16 |
| 5864199 | Electron beam emitting tungsten filament | Roger Alvis, Janice Gray | 1999-01-26 |
| 5847821 | Use of fiducial marks for improved blank wafer defect review | Donald L. Wollesen | 1998-12-08 |
| 5770519 | Copper reservoir for reducing electromigration effects associated with a conductive via in a semiconductor device | Richard K. Klein, Darrell M. Erb, Steven C. Avanzino, Robin Cheung, Scott Luning +2 more | 1998-06-23 |
| 5727978 | Method of forming electron beam emitting tungsten filament | Roger Alvis, Janice Gray | 1998-03-17 |
| 5713667 | Temperature sensing probe for microthermometry | Roger Alvis, Andrew Norman Erickson, Ayesha R. Raheem Kizchery, Jeremias D. Romero | 1998-02-03 |
| 5646448 | Copper pellet for reducing electromigration effects associated with a conductive via in a semiconductor device | Richard K. Klein, Darrell M. Erb, Steven C. Avanzino, Robin Cheung, Scott Luning +2 more | 1997-07-08 |
| 5639691 | Copper pellet for reducing electromigration effects associated with a conductive via in a semiconductor device | Richard K. Klein, Darrell M. Erb, Steven C. Avanzino, Robin Cheung, Scott Luning +2 more | 1997-06-17 |