Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor wafer optical scanning system and method using swath-area defect limitation

Semiconductor wafer optical scanning system and method using swath-area defect limitation

US Patent 6011619 · Granted Jan 4, 2000

Estimated economic value: $4,612,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Displaying module and displaying device2025
Quick-release assembly and virtual reality device2025
Curved optical plate and method of manufacturing the same, backlight module and 2025
Display device and control method therefor2025
Pixel unit, display substrate and driving method thereof, and display apparatus2024
Display panel and driving method thereof, and display device2024
Pixel structure, display panel, and display device2024
Method and apparatus for compensating displayed picture, device thereof, and dri2024
Dimming assembly, backlight module, and liquid crystal display device2024
Alignment deviation detection method and apparatus thereof, data compensation me2023
Display panel driving method and driving device, display device, and storage med2023
Display device2023