Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9728414 | Method of depositing copper using physical vapor deposition | Wen Yu, Stephen B. Robie | 2017-08-08 |
| 8791018 | Method of depositing copper using physical vapor deposition | Wen Yu, Stephen B. Robie | 2014-07-29 |
| 7169706 | Method of using an adhesion precursor layer for chemical vapor deposition (CVD) copper deposition | Sergey Lopatin, Paul R. Besser, Alline F. Myers, Minh Quoc Tran, Lu You +1 more | 2007-01-30 |
| 6992004 | Implanted barrier layer to improve line reliability and method of forming same | Paul R. Besser, Matthew S. Buynoski, Minh Quoc Tran, Pin-Chin Connie Wang, Lu You +1 more | 2006-01-31 |
| 6791081 | Method for determining pore characteristics in porous materials | Robert M. Ulfig, Suzette K. Pangrle, Alline F. Myers | 2004-09-14 |
| 6518167 | Method of forming a metal or metal nitride interface layer between silicon nitride and copper | Lu You, Matthew S. Buynoski, Paul R. Besser, Pin-Chin Connie Wang, Minh Quoc Tran | 2003-02-11 |
| 5713667 | Temperature sensing probe for microthermometry | Roger Alvis, Andrew Norman Erickson, Ayesha R. Raheem Kizchery, Bryan Tracy | 1998-02-03 |
| 5707484 | Method of accurate compositional analysis of dielectric films on semiconductors | Roger Alvis, Homi Fatemi | 1998-01-13 |
| 5290588 | TiW barrier metal process | Homi Fatemi, Eugene A. Delenia, Muhib M. Khan | 1994-03-01 |