Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7245133 | Integration of photon emission microscope and focused ion beam | Chun-Cheng Tsao | 2007-07-17 |
| 7036109 | Imaging integrated circuits with focused ion beam | Chun-Cheng Tsao, Theodore Lundquist, William B. Thompson, Erwan Le Roy | 2006-04-25 |
| 7029595 | Selective etch for uniform metal trace exposure and milling using focused ion beam system | Xia Li, Rosalinda M. Ring | 2006-04-18 |
| 5290588 | TiW barrier metal process | Jeremias D. Romero, Homi Fatemi, Muhib M. Khan | 1994-03-01 |