Issued Patents All Time
Showing 25 most recent of 47 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7062399 | Resistivity analysis | Michael R. Bruce, Victoria J. Bruce, Edward Jr. I. Cole, Charles F. Hawkins, Paiboon Tangyungong | 2006-06-13 |
| 7029595 | Selective etch for uniform metal trace exposure and milling using focused ion beam system | Xia Li, Eugene A. Delenia | 2006-04-18 |
| 7019511 | Optical analysis of integrated circuits | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Daniel L. Stone | 2006-03-28 |
| 6870379 | Indirect stimulation of an integrated circuit die | Brennan V. Davis, Victoria J. Bruce, Michael R. Bruce, David H. Eppes | 2005-03-22 |
| 6864972 | IC die analysis via back side lens | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Daniel L. Stone | 2005-03-08 |
| 6850081 | Semiconductor die analysis via fiber optic communication | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Daniel L. Stone | 2005-02-01 |
| 6844928 | Fiber optic semiconductor analysis arrangement and method therefor | Glen Gilfeather, Srikar V. Chunduri, Brennan V. Davis, David H. Eppes, Victoria J. Bruce +2 more | 2005-01-18 |
| 6806166 | Substrate removal as a function of emitted photons at the back side of a semiconductor chip | Jeffrey D. Birdsley, Michael R. Bruce, Rama R. Goruganthu, Brennan V. Davis | 2004-10-19 |
| 6806198 | Gas-assisted etch with oxygen | Susan Xia Li, Richard C. Blish, II | 2004-10-19 |
| 6720641 | Semiconductor structure having backside probe points for direct signal access from active and well regions | Jeffrey D. Birdsley, Rama R. Goruganthu | 2004-04-13 |
| 6700659 | Semiconductor analysis arrangement and method therefor | Srikar V. Chunduri, Glen Gilfeather, Brennan V. Davis, David H. Eppes, Victoria J. Bruce +2 more | 2004-03-02 |
| 6686757 | Defect detection in semiconductor devices | Rama R. Goruganthu, Brennan V. Davis, Jeffrey D. Birdsley, Michael R. Bruce | 2004-02-03 |
| 6635839 | Semiconductor analysis arrangement and method therefor | Glen Gilfeather, Srikar V. Chunduri, Brennan V. Davis, David H. Eppes, Victoria J. Bruce +2 more | 2003-10-21 |
| 6635572 | Method of substrate silicon removal for integrated circuit devices | Rama R. Goruganthu, Richard W. Johnson | 2003-10-21 |
| 6621281 | SOI die analysis of circuitry logic states via coupling through the insulator | Jeffrey D. Birdsley, Brennan V. Davis, Daniel L. Stone, Michael R. Bruce | 2003-09-16 |
| 6576484 | IC die analysis via back side circuit construction with heat dissipation | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Daniel L. Stone | 2003-06-10 |
| 6565720 | Substrate removal as a function of sputtered ions | — | 2003-05-20 |
| 6549022 | Apparatus and method for analyzing functional failures in integrated circuits | Edward I. Cole, Jr., Paiboon Tangyunyong, Charles F. Hawkins, Michael R. Bruce, Victoria J. Bruce | 2003-04-15 |
| 6546513 | Data processing device test apparatus and method therefor | Richard Wilcox, Jason Mulig, David H. Eppes, Michael R. Bruce, Victoria J. Bruce +4 more | 2003-04-08 |
| 6529029 | Magnetic resonance imaging of semiconductor devices | Michael R. Bruce, Jeffrey D. Birdsley, Rama R. Goruganthu, Brennan V. Davis | 2003-03-04 |
| 6518783 | Circuit construction in back side of die and over a buried insulator | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Daniel L. Stone, Rama R. Goruganthu | 2003-02-11 |
| 6500699 | Test fixture for future integration | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Daniel L. Stone | 2002-12-31 |
| 6483327 | Quadrant avalanche photodiode time-resolved detection | Michael R. Bruce, Victoria J. Bruce, Jeffrey D. Birdsley, Rama R. Goruganthu, Brennan V. Davis | 2002-11-19 |
| 6472760 | Nanomachining of integrated circuits | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis | 2002-10-29 |
| 6455334 | Probe grid for integrated circuit analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Glen Gilfeather | 2002-09-24 |