Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10145894 | Defect screening method for electronic circuits and circuit components using power spectrum anaylysis | Joshua Beutler, Edward I. Cole, Jr., Guillermo M. Loubriel | 2018-12-04 |
| 10094874 | Scanning method for screening of electronic devices | Edward I. Cole, Jr., Guillermo M. Loubriel, Joshua Beutler | 2018-10-09 |
| 9188622 | Power spectrum analysis for defect screening in integrated circuit devices | Edward I. Cole, Jr., David J. Stein | 2015-11-17 |
| 7525325 | System and method for floating-substrate passive voltage contrast | Mark W. Jenkins, Edward I. Cole, Jr., Jerry M. Soden, Jeremy A. Walraven, Alejandro A. Pimentel | 2009-04-28 |
| 6549022 | Apparatus and method for analyzing functional failures in integrated circuits | Edward I. Cole, Jr., Charles F. Hawkins, Michael R. Bruce, Victoria J. Bruce, Rosalinda M. Ring | 2003-04-15 |
| 6546513 | Data processing device test apparatus and method therefor | Richard Wilcox, Jason Mulig, David H. Eppes, Michael R. Bruce, Victoria J. Bruce +4 more | 2003-04-08 |
| 5705821 | Scanning fluorescent microthermal imaging apparatus and method | Daniel L. Barton | 1998-01-06 |