Issued Patents All Time
Showing 25 most recent of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9354185 | 3D imaging with multiple irradiation frequencies | Farid Barakat, Lihong Cao | 2016-05-31 |
| 7088852 | Three-dimensional tomography | Michael R. Bruce, Glen Gilfeather | 2006-08-08 |
| 7062399 | Resistivity analysis | Michael R. Bruce, Rosalinda M. Ring, Edward Jr. I. Cole, Charles F. Hawkins, Paiboon Tangyungong | 2006-06-13 |
| 6870379 | Indirect stimulation of an integrated circuit die | Brennan V. Davis, Michael R. Bruce, Rosalinda M. Ring, David H. Eppes | 2005-03-22 |
| 6844928 | Fiber optic semiconductor analysis arrangement and method therefor | Glen Gilfeather, Srikar V. Chunduri, Brennan V. Davis, David H. Eppes, Michael R. Bruce +2 more | 2005-01-18 |
| 6714294 | De broglie microscope | Michael R. Bruce, Rama R. Goruganthu | 2004-03-30 |
| 6700659 | Semiconductor analysis arrangement and method therefor | Srikar V. Chunduri, Glen Gilfeather, Brennan V. Davis, David H. Eppes, Michael R. Bruce +2 more | 2004-03-02 |
| 6635839 | Semiconductor analysis arrangement and method therefor | Glen Gilfeather, Srikar V. Chunduri, Brennan V. Davis, David H. Eppes, Michael R. Bruce +2 more | 2003-10-21 |
| 6617862 | Laser intrusive technique for locating specific integrated circuit current paths | — | 2003-09-09 |
| 6549022 | Apparatus and method for analyzing functional failures in integrated circuits | Edward I. Cole, Jr., Paiboon Tangyunyong, Charles F. Hawkins, Michael R. Bruce, Rosalinda M. Ring | 2003-04-15 |
| 6546513 | Data processing device test apparatus and method therefor | Richard Wilcox, Jason Mulig, David H. Eppes, Michael R. Bruce, Rosalinda M. Ring +4 more | 2003-04-08 |
| 6545490 | Trench-filled probe point for a semiconductor device | — | 2003-04-08 |
| 6483327 | Quadrant avalanche photodiode time-resolved detection | Michael R. Bruce, Jeffrey D. Birdsley, Rosalinda M. Ring, Rama R. Goruganthu, Brennan V. Davis | 2002-11-19 |
| 6417068 | Semiconductor device navigation using laser scribing | Susan Xia Li, Jeffrey D. Birdsley | 2002-07-09 |
| 6410349 | Internal anti-reflective coating for interference reduction | Michael R. Bruce, Gregory A. Dabney | 2002-06-25 |
| 6375347 | Method for laser scanning flip-chip integrated circuits | Michael R. Bruce | 2002-04-23 |
| 6350982 | Inducement and detection of latch-up using a laser scanning microscope | Michael R. Bruce | 2002-02-26 |
| 6348364 | Navigation using 3-D detectable pattern | Leslie Stevenson, Kenneth J. Morrissey, Charles K. Bachand | 2002-02-19 |
| 6300148 | Semiconductor structure with a backside protective layer and backside probes and a method for constructing the structure | Jeffrey D. Birdsley, Amy Elizabeth Lane | 2001-10-09 |
| 6285036 | Endpoint detection for thinning of silicon of a flip chip bonded integrated circuit | Rama R. Goruganthu, Glen Gilfeather | 2001-09-04 |
| 6210981 | Method for etching a flip chip using secondary particle emissions to detect the etch end-point | Jeffrey D. Birdsley | 2001-04-03 |
| 6146014 | Method for laser scanning flip-chip integrated circuits | Michael R. Bruce | 2000-11-14 |
| 6107107 | Analyzing an electronic circuit formed upon a frontside surface of a semiconductor substrate by detecting radiation exiting a backside surface coated with an antireflective material | Gregory A. Dabney | 2000-08-22 |
| 6069366 | Endpoint detection for thinning of silicon of a flip chip bonded integrated circuit | Rama R. Goruganthu, Glen Gilfeather | 2000-05-30 |
| 5661520 | Energy resolved emission microscopy system and method | — | 1997-08-26 |