Issued Patents All Time
Showing 25 most recent of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7196800 | Semiconductor die analysis as a function of optical reflections from the die | Rama R. Goruganthu, Michael R. Bruce | 2007-03-27 |
| 7019511 | Optical analysis of integrated circuits | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2006-03-28 |
| 6864972 | IC die analysis via back side lens | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2005-03-08 |
| 6850081 | Semiconductor die analysis via fiber optic communication | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2005-02-01 |
| 6806166 | Substrate removal as a function of emitted photons at the back side of a semiconductor chip | Michael R. Bruce, Rama R. Goruganthu, Brennan V. Davis, Rosalinda M. Ring | 2004-10-19 |
| 6720641 | Semiconductor structure having backside probe points for direct signal access from active and well regions | Rosalinda M. Ring, Rama R. Goruganthu | 2004-04-13 |
| 6686757 | Defect detection in semiconductor devices | Rosalinda M. Ring, Rama R. Goruganthu, Brennan V. Davis, Michael R. Bruce | 2004-02-03 |
| 6621281 | SOI die analysis of circuitry logic states via coupling through the insulator | Brennan V. Davis, Daniel L. Stone, Michael R. Bruce, Rosalinda M. Ring | 2003-09-16 |
| 6576484 | IC die analysis via back side circuit construction with heat dissipation | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2003-06-10 |
| 6529029 | Magnetic resonance imaging of semiconductor devices | Michael R. Bruce, Rosalinda M. Ring, Rama R. Goruganthu, Brennan V. Davis | 2003-03-04 |
| 6518783 | Circuit construction in back side of die and over a buried insulator | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone, Rama R. Goruganthu | 2003-02-11 |
| 6500699 | Test fixture for future integration | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2002-12-31 |
| 6483327 | Quadrant avalanche photodiode time-resolved detection | Michael R. Bruce, Victoria J. Bruce, Rosalinda M. Ring, Rama R. Goruganthu, Brennan V. Davis | 2002-11-19 |
| 6472760 | Nanomachining of integrated circuits | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-10-29 |
| 6455334 | Probe grid for integrated circuit analysis | Rama R. Goruganthu, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Glen Gilfeather | 2002-09-24 |
| 6448096 | Atomic force microscopy and signal acquisition via buried insulator | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2002-09-10 |
| 6448095 | Circuit access and analysis for a SOI flip-chip die | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2002-09-10 |
| 6433572 | Intergrated circuit integrity analysis as a function of magnetic field decay | Michael R. Bruce, Rama R. Goruganthu, Brennan V. Davis, Rosalinda M. Ring | 2002-08-13 |
| 6430728 | Acoustic 3D analysis of circuit structures | Rama R. Goruganthu, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-08-06 |
| 6428718 | Selective back side wet etch | Brennan V. Davis | 2002-08-06 |
| 6421811 | Defect detection via acoustic analysis | Rama R. Goruganthu, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-07-16 |
| 6417680 | Method and apparatus for stress testing a semiconductor device using laser-induced circuit excitation | Rama R. Goruganthu, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-07-09 |
| 6417068 | Semiconductor device navigation using laser scribing | Victoria J. Bruce, Susan Xia Li | 2002-07-09 |
| 6414335 | Selective state change analysis of a SOI die | Rama R. Goruganthu, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2002-07-02 |
| 6403388 | Nanomachining method for integrated circuits | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2002-06-11 |