Issued Patents All Time
Showing 25 most recent of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7019511 | Optical analysis of integrated circuits | Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Daniel L. Stone | 2006-03-28 |
| 6897664 | Laser beam induced phenomena detection | Michael R. Bruce, Gregory A. Dabney, Palaniappan Muthupalaniappan, Jiann Min Chin, Richard Wilcox +6 more | 2005-05-24 |
| 6870379 | Indirect stimulation of an integrated circuit die | Victoria J. Bruce, Michael R. Bruce, Rosalinda M. Ring, David H. Eppes | 2005-03-22 |
| 6864972 | IC die analysis via back side lens | Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Daniel L. Stone | 2005-03-08 |
| 6850081 | Semiconductor die analysis via fiber optic communication | Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Daniel L. Stone | 2005-02-01 |
| 6844928 | Fiber optic semiconductor analysis arrangement and method therefor | Glen Gilfeather, Srikar V. Chunduri, David H. Eppes, Victoria J. Bruce, Michael R. Bruce +2 more | 2005-01-18 |
| 6828809 | Photon detection enhancement of superconducting hot-electron photodetectors | Michael R. Bruce, Robert Powell, Rama R. Goruganthu, Thomas Chu, Miguel Santana, Jr. | 2004-12-07 |
| 6806166 | Substrate removal as a function of emitted photons at the back side of a semiconductor chip | Jeffrey D. Birdsley, Michael R. Bruce, Rama R. Goruganthu, Rosalinda M. Ring | 2004-10-19 |
| 6724928 | Real-time photoemission detection system | — | 2004-04-20 |
| 6700659 | Semiconductor analysis arrangement and method therefor | Srikar V. Chunduri, Glen Gilfeather, David H. Eppes, Victoria J. Bruce, Michael R. Bruce +2 more | 2004-03-02 |
| 6686757 | Defect detection in semiconductor devices | Rosalinda M. Ring, Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce | 2004-02-03 |
| 6635839 | Semiconductor analysis arrangement and method therefor | Glen Gilfeather, Srikar V. Chunduri, David H. Eppes, Victoria J. Bruce, Michael R. Bruce +2 more | 2003-10-21 |
| 6621281 | SOI die analysis of circuitry logic states via coupling through the insulator | Jeffrey D. Birdsley, Daniel L. Stone, Michael R. Bruce, Rosalinda M. Ring | 2003-09-16 |
| 6576484 | IC die analysis via back side circuit construction with heat dissipation | Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Daniel L. Stone | 2003-06-10 |
| 6529029 | Magnetic resonance imaging of semiconductor devices | Michael R. Bruce, Jeffrey D. Birdsley, Rosalinda M. Ring, Rama R. Goruganthu | 2003-03-04 |
| 6518783 | Circuit construction in back side of die and over a buried insulator | Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Daniel L. Stone, Rama R. Goruganthu | 2003-02-11 |
| 6500699 | Test fixture for future integration | Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Daniel L. Stone | 2002-12-31 |
| 6483327 | Quadrant avalanche photodiode time-resolved detection | Michael R. Bruce, Victoria J. Bruce, Jeffrey D. Birdsley, Rosalinda M. Ring, Rama R. Goruganthu | 2002-11-19 |
| 6472760 | Nanomachining of integrated circuits | Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2002-10-29 |
| 6455334 | Probe grid for integrated circuit analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Glen Gilfeather | 2002-09-24 |
| 6452176 | Arrangement and method for using electron channeling patterns to detect substrate damage | — | 2002-09-17 |
| 6448095 | Circuit access and analysis for a SOI flip-chip die | Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Daniel L. Stone | 2002-09-10 |
| 6448096 | Atomic force microscopy and signal acquisition via buried insulator | Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Daniel L. Stone | 2002-09-10 |
| 6433572 | Intergrated circuit integrity analysis as a function of magnetic field decay | Jeffrey D. Birdsley, Michael R. Bruce, Rama R. Goruganthu, Rosalinda M. Ring | 2002-08-13 |
| 6428718 | Selective back side wet etch | Jeffrey D. Birdsley | 2002-08-06 |