Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6430728 | Acoustic 3D analysis of circuit structures | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2002-08-06 |
| 6421811 | Defect detection via acoustic analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2002-07-16 |
| 6417680 | Method and apparatus for stress testing a semiconductor device using laser-induced circuit excitation | Jeffrey D. Birdsley, Rama R. Goruganthu, Michael R. Bruce, Rosalinda M. Ring | 2002-07-09 |
| 6414335 | Selective state change analysis of a SOI die | Rama R. Goruganthu, Michael R. Bruce, Rosalinda M. Ring, Daniel L. Stone, Jeffrey D. Birdsley | 2002-07-02 |
| 6403388 | Nanomachining method for integrated circuits | Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Daniel L. Stone | 2002-06-11 |
| 6391664 | Selectively activatable solar cells for integrated circuit analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2002-05-21 |
| 6387715 | Integrated circuit defect detection via laser heat and IR thermography | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2002-05-14 |
| 6372529 | Forming elongated probe points useful in testing semiconductor devices | Rosalinda M. Ring, Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce | 2002-04-16 |
| 6352871 | Probe grid for integrated circuit excitation | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring, Glen Gilfeather | 2002-03-05 |
| 6350624 | Substrate removal as a functional of sonic analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2002-02-26 |
| 6303396 | Substrate removal as a function of resistance at the back side of a semiconductor device | Rosalinda M. Ring, Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce | 2001-10-16 |
| 6300145 | Ion implantation and laser anneal to create n-doped structures in silicon | Jeffrey D. Birdsley, Rama R. Goruganthu, Michael R. Bruce, Rosalinda M. Ring | 2001-10-09 |
| 6281028 | LED alignment points for semiconductor die | Michael R. Bruce, Jeffrey D. Birdsley, Rosalinda M. Ring, Rama R. Goruganthu | 2001-08-28 |
| 6281025 | Substrate removal as a function of SIMS analysis | Rosalinda M. Ring, Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce | 2001-08-28 |
| 6281029 | Probe points for heat dissipation during testing of flip chip IC | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2001-08-28 |
| 6277659 | Substrate removal using thermal analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2001-08-21 |
| 6277656 | Substrate removal as a function of acoustic analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2001-08-21 |
| 6248600 | Led in substrate with back side monitoring | Michael R. Bruce, Jeffrey D. Birdsley, Rosalinda M. Ring, Rama R. Goruganthu | 2001-06-19 |