Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Atomic force microscopy and signal acquisition via buried insulator

Atomic force microscopy and signal acquisition via buried insulator

US Patent 6448096 · Granted Sep 10, 2002

Estimated economic value: $1,244,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Precision probe positioning for at-speed integrated circuit testing using throug2018
At-speed integrated circuit testing using through silicon in-circuit logic analy2017
Semiconductor chip with backside conductor structure2013
Silicon photon detector2012
Solid immersion lens lithography2012
Semiconductor chip with backside conductor structure2011
Thermally conductive integrated circuit mounting structures2007
Electrical probing of SOI circuits2007
Semiconductor die analysis as a function of optical reflections from the die2007
Semiconductor die analysis as a function of optical reflections from the die2007
Three-dimensional tomography2006
Resistivity analysis2006