Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10254334 | Test circuits for integrated circuit counterfeit detection | Ryan Helinski, Lyndon G. Pierson, Tan Q. Thai | 2019-04-09 |
| 10145894 | Defect screening method for electronic circuits and circuit components using power spectrum anaylysis | Paiboon Tangyunyong, Joshua Beutler, Guillermo M. Loubriel | 2018-12-04 |
| 10094874 | Scanning method for screening of electronic devices | Paiboon Tangyunyong, Guillermo M. Loubriel, Joshua Beutler | 2018-10-09 |
| 10060973 | Test circuits for integrated circuit counterfeit detection | Ryan Helinski, Lyndon G. Pierson, Tan Q. Thai | 2018-08-28 |
| 9599667 | Visible light laser voltage probing on thinned substrates | Joshua Beutler, John Clement, Mary A. Miller, Jeffrey Stevens | 2017-03-21 |
| 9188622 | Power spectrum analysis for defect screening in integrated circuit devices | Paiboon Tangyunyong, David J. Stein | 2015-11-17 |
| 7525325 | System and method for floating-substrate passive voltage contrast | Mark W. Jenkins, Paiboon Tangyunyong, Jerry M. Soden, Jeremy A. Walraven, Alejandro A. Pimentel | 2009-04-28 |
| 6549022 | Apparatus and method for analyzing functional failures in integrated circuits | Paiboon Tangyunyong, Charles F. Hawkins, Michael R. Bruce, Victoria J. Bruce, Rosalinda M. Ring | 2003-04-15 |
| 6546513 | Data processing device test apparatus and method therefor | Richard Wilcox, Jason Mulig, David H. Eppes, Michael R. Bruce, Victoria J. Bruce +4 more | 2003-04-08 |
| 6407560 | Thermally-induced voltage alteration for analysis of microelectromechanical devices | Jeremy A. Walraven | 2002-06-18 |
| 6078183 | Thermally-induced voltage alteration for integrated circuit analysis | — | 2000-06-20 |
| 6031386 | Apparatus and method for defect testing of integrated circuits | Jerry M. Soden | 2000-02-29 |
| 5781017 | Capacitive charge generation apparatus and method for testing circuits | Kenneth A. Peterson, Daniel L. Barton | 1998-07-14 |
| 5523694 | Integrated circuit failure analysis by low-energy charge-induced voltage alteration | — | 1996-06-04 |
| 5465046 | Magnetic force microscopy method and apparatus to detect and image currents in integrated circuits | Ann. N. Campbell, Richard E. Anderson | 1995-11-07 |
| 5430305 | Light-induced voltage alteration for integrated circuit analysis | Jerry M. Soden | 1995-07-04 |