Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10145894 | Defect screening method for electronic circuits and circuit components using power spectrum anaylysis | Paiboon Tangyunyong, Edward I. Cole, Jr., Guillermo M. Loubriel | 2018-12-04 |
| 10094874 | Scanning method for screening of electronic devices | Paiboon Tangyunyong, Edward I. Cole, Jr., Guillermo M. Loubriel | 2018-10-09 |
| 9599667 | Visible light laser voltage probing on thinned substrates | John Clement, Mary A. Miller, Jeffrey Stevens, Edward I. Cole, Jr. | 2017-03-21 |