Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11114274 | Method and system for testing an integrated circuit | Baohua Niu | 2021-09-07 |
| 11047906 | Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets | Kent B. Erington, Daniel J. Bodoh, Keith Serrels | 2021-06-29 |
| 10768224 | High frequency lock-in thermography using single photon detectors | Euan Ramsay | 2020-09-08 |
| 10191111 | Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets | Kent B. Erington, Daniel J. Bodoh, Keith Serrels | 2019-01-29 |
| 7884024 | Apparatus and method for optical interference fringe based integrated circuit processing | Erwan Le Roy, Chun-Cheng Tsao, Rajesh Jain | 2011-02-08 |
| 7883630 | FIB milling of copper over organic dielectrics | Vladimir Makarov | 2011-02-08 |
| 7842920 | Methods and systems of performing device failure analysis, electrical characterization and physical characterization | — | 2010-11-30 |
| 7786436 | FIB based open via analysis and repair | Ketan Shah, Tamayasu Anayama, Mark Andrew Thompson | 2010-08-31 |
| 7697146 | Apparatus and method for optical interference fringe based integrated circuit processing | Erwan Le Roy, Chun-Cheng Tsao | 2010-04-13 |
| 7530034 | Apparatus and method for circuit operation definition | Martin Betz, Lokesh Johri, Rajesh Jain, Tamal Basu, Saurabh Gupta +1 more | 2009-05-05 |
| 7439168 | Apparatus and method of forming silicide in a localized manner | Christian Boit, Chun-Cheng Tsao, Uwe Kerst, Stephan Schoemann, Peter Sadewater | 2008-10-21 |
| 7409653 | Sub-resolution alignment of images | Madhumita Sengupta, Mamta Slnha, William Henry Thompson | 2008-08-05 |
| 7400154 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Philippe Perdu, Ketan Shah | 2008-07-15 |
| 7135678 | Charged particle guide | Qinsong Steve Wang, Tzong-Tsong Miau | 2006-11-14 |
| 7135123 | Method and system for integrated circuit backside navigation | Mark Thompson, Erwan Le Roy, William B. Thompson, Catherine Kardach | 2006-11-14 |
| 7115426 | Method and apparatus for addressing thickness variations of a trench floor formed in a semiconductor substrate | Erwan Le Roy, Patricia Le Coupanec, William B. Thompson, Mark Thompson, Lokesh Johri | 2006-10-03 |
| 7060196 | FIB milling of copper over organic dielectrics | Vladimir Makarov | 2006-06-13 |
| 7036109 | Imaging integrated circuits with focused ion beam | Chun-Cheng Tsao, William B. Thompson, Erwan Le Roy, Eugene A. Delenia | 2006-04-25 |
| 6943572 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Philippe Perdu, Ketan Shah | 2005-09-13 |
| 6905623 | Precise, in-situ endpoint detection for charged particle beam processing | Kenneth Wilsher | 2005-06-14 |
| 6872581 | Measuring back-side voltage of an integrated circuit | Christopher Shaw, Chun-Cheng Tsao | 2005-03-29 |
| 6848087 | Sub-resolution alignment of images | Madhumita Sengupta, Mamta Sinha, William Henry Thompson | 2005-01-25 |
| 5905266 | Charged particle beam system with optical microscope | Xavier Larduinat, James Henry Brown | 1999-05-18 |
| 5840630 | FBI etching enhanced with 1,2 di-iodo-ethane | Michael A. Cecere | 1998-11-24 |