Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12300293 | Method for writing to magnetic random access memory | Ji-Feng Ying, Jhong-Sheng Wang | 2025-05-13 |
| 12082511 | Magnetic random access memory | Ji-Feng Ying | 2024-09-03 |
| 11762046 | Method and apparatus for measuring magnetic field strength | Ji-Feng Ying | 2023-09-19 |
| 11727974 | Method for writing to magnetic random access memory | Ji-Feng Ying, Jhong-Sheng Wang | 2023-08-15 |
| 11525668 | Apparatus and method for metrology | Ji-Feng Ying, David Hung-I Su | 2022-12-13 |
| 11374169 | Magnetic random access memory | Ji-Feng Ying | 2022-06-28 |
| 11238911 | Method for writing to magnetic random access memory | Ji-Feng Ying, Jhong-Sheng Wang | 2022-02-01 |
| 11127788 | Semiconductor device having magnetic tunnel junction (MTJ) stack | Da-Shou Chen | 2021-09-21 |
| 11114274 | Method and system for testing an integrated circuit | Theodore Lundquist | 2021-09-07 |
| 11062903 | Method and apparatus for manufacturing semiconductor device | Neena Avinash Gilda, Lien-Yao Tsai | 2021-07-13 |
| 10883820 | Apparatus and method for metrology | Ji-Feng Ying, David Hung-I Su | 2021-01-05 |
| 10868079 | Magnetic detection circuit, MRAM and operation method thereof | Ji-Feng Ying | 2020-12-15 |
| 10861574 | Apparatus for memory device testing and field applications | Ji-Feng Ying | 2020-12-08 |
| 10861929 | Electronic device including a capacitor | Kai-Fung Chang, Lien-Yao Tsai, Yi-Chuan Teng, Chi-Yuan Shih | 2020-12-08 |
| 10777733 | Method and apparatus for manufacturing semiconductor device | Neena Avinash Gilda, Lien-Yao Tsai | 2020-09-15 |
| 10753990 | Method and apparatus for measuring magnetic field strength | Ji-Feng Ying | 2020-08-25 |
| 10727401 | Magnetic random access memory | Ji-Feng Ying | 2020-07-28 |
| 10685693 | Method for writing to magnetic random access memory | Ji-Feng Ying, Jhong-Sheng Wang | 2020-06-16 |
| 10672832 | Magnetic detection circuit, MRAM and operation method thereof | Ji-Feng Ying | 2020-06-02 |
| 10510410 | Method for programming resistive memory cell with AC perturbation AC signal and nonvolatile memory device thereof | Ji-Feng Ying, Jhong-Sheng Wang | 2019-12-17 |
| 10403385 | Apparatus for memory device testing and field applications | Ji-Feng Ying | 2019-09-03 |
| 10345373 | Method for inspecting semiconductor device structure | Chia-Nan Ke, Chi-Chun Lin | 2019-07-09 |
| 8687192 | Through silicon imaging and probing | Patrick Pardy, David L. Budka, Mitchell L. Sacks | 2014-04-01 |