Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11525668 | Apparatus and method for metrology | Ji-Feng Ying, Baohua Niu | 2022-12-13 |
| 10883820 | Apparatus and method for metrology | Baohua Niu, Ji-Feng Ying | 2021-01-05 |
| 10679820 | Inspection method for wafer or DUT | Bao-Hua Niu, Jung-Hsiang Chuang | 2020-06-09 |
| 10141158 | Wafer and DUT inspection apparatus and method using thereof | Bao-Hua Niu, Jung-Hsiang Chuang | 2018-11-27 |