Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10679820 | Inspection method for wafer or DUT | Bao-Hua Niu, David Hung-I Su | 2020-06-09 |
| 10141158 | Wafer and DUT inspection apparatus and method using thereof | Bao-Hua Niu, David Hung-I Su | 2018-11-27 |
| 6930502 | Method using conductive atomic force microscopy to measure contact leakage current | Jon Lee | 2005-08-16 |