Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10679820 | Inspection method for wafer or DUT | Jung-Hsiang Chuang, David Hung-I Su | 2020-06-09 |
| 10141158 | Wafer and DUT inspection apparatus and method using thereof | Jung-Hsiang Chuang, David Hung-I Su | 2018-11-27 |