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Apparatus and method for probing integrated circuits using polarization difference probing |
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Apparatus and method for probing integrated circuits using laser illumination |
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2009-11-10 |
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Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system |
Gary Woods, Steven Kasapi |
2008-11-11 |
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PICA system timing measurement and calibration |
— |
2007-06-05 |
| 7049593 |
Superconducting single photon detector |
Roman Sobolewski, Grigory N. Gol'tsman, Alexey D. Semenov, Oleg V. Okunev, Steven Kasapi |
2006-05-23 |
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Optical coupling for testing integrated circuits |
Steven Kasapi |
2006-05-09 |
| 6985219 |
Optical coupling for testing integrated circuits |
Steven Kasapi |
2006-01-10 |
| 6967491 |
Spatial and temporal selective laser assisted fault localization |
Philippe Perdu, Romain Desplats, Felix Beaudoin, Praveen Vedagarbha, Martin Leibowitz |
2005-11-22 |
| 6905623 |
Precise, in-situ endpoint detection for charged particle beam processing |
Theodore Lundquist |
2005-06-14 |
| 6819117 |
PICA system timing measurement & calibration |
— |
2004-11-16 |
| 6812464 |
Superconducting single photon detector |
Roman Sobolewski, Grigory N. Gol'tsman, Alexey D. Semenov, Oleg V. Okunev, Steven Kasapi |
2004-11-02 |
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Method and apparatus for accessing internal nodes of an integrated circuit using IC package substrate |
— |
2004-08-24 |
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Photoconductive-sampling voltage measurement |
Francis Ho |
2004-05-18 |
| 6501288 |
On-chip optically triggered latch for IC time measurements |
— |
2002-12-31 |
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Double-pulsed optical interferometer for waveform probing of integrated circuits |
William Lo |
2002-12-17 |
| 5905577 |
Dual-laser voltage probing of IC's |
Suresh Rajan, William Lo |
1999-05-18 |
| 5287022 |
Method and circuit for controlling voltage reflections on transmission lines |
— |
1994-02-15 |
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Pulsed laser photoemission electron-beam probe |
Neil Richardson |
1993-12-14 |
