FH

Francis Ho

CI Computer Products, Incorporated: 5 patents #1 of 14Top 8%
Stanford University: 3 patents #828 of 5,197Top 20%
IN Inphi: 2 patents #137 of 228Top 65%
MC Meiloon Industrial Co.: 2 patents #3 of 24Top 15%
JT Japan Science And Technology: 1 patents #225 of 836Top 30%
NP Nptest: 1 patents #5 of 32Top 20%
📍 Nanhu, CA: #62 of 269 inventorsTop 25%
Overall (All Time): #298,385 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
9423211 Locking container for firearms 2016-08-23
9053009 High throughput flash memory system 2015-06-09
8316175 High throughput flash memory system 2012-11-20
7252383 Wireless audio output assembly for projectors Henry Chien, Yu-Chin Li, Wen-Hung Hsu, Chung-Hua Tsai, Minglu Chen 2007-08-07
6959991 Integrated projector Minglu Chen, Ray Chiu, Kevin Kao, Jin Fu Sun, Bear Tsai +8 more 2005-11-01
6737853 Photoconductive-sampling voltage measurement Kenneth Wilsher 2004-05-18
6588673 Method and system providing in-line pre-production data preparation and personalization solutions for smart cards Victor Chan 2003-07-08
6086774 Method of making released micromachined structures by directional etching Yoshihisa Yamamoto 2000-07-11
5995383 Low cost AC-to-DC converter having input current with reduced harmonics Franki Ngai Kit Poon, Robert Chun Fung Lee, Fu-Sheng Tsai 1999-11-30
5847569 Electrical contact probe for sampling high frequency electrical signals David M. Bloom 1998-12-08
5815061 Low cost and manufacturable transformer meeting safety requirements 1998-09-29
5751561 Low cost AC-to-DC converter having input current with reduced harmonics Robert Chun Fung Lee 1998-05-12
5652700 Low cost AC-to-DC converter having input current with reduced harmonics Fu-Sheng Tsai, Franki Ngai Kit Poon, Robert Chun Fung Lee 1997-07-29
5600546 Input harmonic current corrected AC-to-DC converter with multiple coupled primary windings Robert Chun Fung Lee 1997-02-04
5488305 System and method for high-speed potentiometry using scanning probe microscope David M. Bloom, Alfred Samson Hou 1996-01-30
5381101 System and method of measuring high-speed electrical waveforms using force microscopy and offset sampling frequencies David M. Bloom, Alfred Samson Hou 1995-01-10