Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
GW

Gary Woods — 18 Patents

Intel: 7 patents #5,443 of 30,777Top 20%
DSDcg Systems: 3 patents #11 of 83Top 15%
CSCredence Systems: 2 patents #63 of 214Top 30%
ITInview Technology: 2 patents #10 of 16Top 65%
WUWilliam Marsh Rice University: 2 patents #189 of 919Top 25%
Qualcomm: 1 patents #7,593 of 12,104Top 65%
Houston, TX: #1,155 of 21,073 inventorsTop 6%
Texas: #7,913 of 125,132 inventorsTop 7%
Overall (All Time): #245,716 of 4,157,543Top 6%
18 Patents All Time
Gary Woods has been granted 18 US patents while listed as an inventor at Intel. The first was granted in 2002 and the most recent in December 2016. Gary Woods ranks #245,716 of 4,157,543 US inventors in our database (top 5.9%). Patent records list Gary Woods in Houston, TX, US.

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
9521306 Apparatus and method for compressive imaging and sensing through multiplexed modulation via spinning disks Kevin F. Kelly, Richard G. Baraniuk, Ting Sun, Matthew Turner 2016-12-13
9124755 Apparatus and method for compressive imaging and sensing through multiplexed modulation Kevin F. Kelly, Richard G. Baraniuk, Ting Sun, Matthew Turner 2015-09-01
8717463 Adaptively filtering compressive imaging measurements to attenuate noise James Merton Tidman 2014-05-06
8634009 Dynamic range optimization in a compressive imaging system Kevin F. Kelly, Lenore McMackin, Robert F. Bridge, James Merton Tidman, Donna E. Hewitt 2014-01-21
8451009 Techniques employing light-emitting circuits Martin Villafana, Michael DiBattista 2013-05-28 $12,768,000
7679358 System and method for voltage noise and jitter measurement using time-resolved emission Steven Kasapi 2010-03-16
7616312 Apparatus and method for probing integrated circuits using laser illumination Steven Kasapi, Kenneth Wilsher, William Lo, Radu Ispasoiu, Nagamani Nataraj +1 more 2009-11-10
7450245 Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system Steven Kasapi, Kenneth Wilsher 2008-11-11
7243039 System and method for determining probing locations on IC Hitesh Suri 2007-07-10 $1,915,000
7232526 Method and apparatus for controlling material removal from semiconductor substrate using induced current endpointing Richard H. Livengood, Paul Winer, Michael DiBattista 2007-06-19 $30,093,000
7012537 Apparatus and method for determining voltage using optical observation Steven Kasapi 2006-03-14 $7,509,000
6780658 Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing Richard H. Livengood, Paul Winer, Michael DiBattista 2004-08-24 $22,522,000
6737880 Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions Samie B. Samaan, Paul D. Madland 2004-05-18 $30,392,000
6596980 Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon counting Stefan Rusu, Harry Muljono, Jeremy Rowlette, Dean J. Grannes 2003-07-22 $27,595,000
6579732 Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing Richard H. Livengood, Paul Winer, Michael DiBattista 2003-06-17 $57,598,000
6519744 Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane Steven G. Seidel, Travis Eiles, Stefan Rusu, Dean J. Grannes 2003-02-11 $38,289,000
6501597 Optical amplifier using wavelength converter Donald A. Pitt, Keith A. Sigg, Jing Tian 2002-12-31
6355494 Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing Richard H. Livengood, Paul Winer, Michael DiBattista 2002-03-12 $133,761,000