Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9521306 | Apparatus and method for compressive imaging and sensing through multiplexed modulation via spinning disks | Kevin F. Kelly, Richard G. Baraniuk, Ting Sun, Matthew Turner | 2016-12-13 |
| 9124755 | Apparatus and method for compressive imaging and sensing through multiplexed modulation | Kevin F. Kelly, Richard G. Baraniuk, Ting Sun, Matthew Turner | 2015-09-01 |
| 8717463 | Adaptively filtering compressive imaging measurements to attenuate noise | James Merton Tidman | 2014-05-06 |
| 8634009 | Dynamic range optimization in a compressive imaging system | Kevin F. Kelly, Lenore McMackin, Robert F. Bridge, James Merton Tidman, Donna E. Hewitt | 2014-01-21 |
| 8451009 | Techniques employing light-emitting circuits | Martin Villafana, Michael DiBattista | 2013-05-28 |
| 7679358 | System and method for voltage noise and jitter measurement using time-resolved emission | Steven Kasapi | 2010-03-16 |
| 7616312 | Apparatus and method for probing integrated circuits using laser illumination | Steven Kasapi, Kenneth Wilsher, William Lo, Radu Ispasoiu, Nagamani Nataraj +1 more | 2009-11-10 |
| 7450245 | Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system | Steven Kasapi, Kenneth Wilsher | 2008-11-11 |
| 7243039 | System and method for determining probing locations on IC | Hitesh Suri | 2007-07-10 |
| 7232526 | Method and apparatus for controlling material removal from semiconductor substrate using induced current endpointing | Richard H. Livengood, Paul Winer, Michael DiBattista | 2007-06-19 |
| 7012537 | Apparatus and method for determining voltage using optical observation | Steven Kasapi | 2006-03-14 |
| 6780658 | Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing | Richard H. Livengood, Paul Winer, Michael DiBattista | 2004-08-24 |
| 6737880 | Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions | Samie B. Samaan, Paul D. Madland | 2004-05-18 |
| 6596980 | Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon counting | Stefan Rusu, Harry Muljono, Jeremy Rowlette, Dean J. Grannes | 2003-07-22 |
| 6579732 | Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing | Richard H. Livengood, Paul Winer, Michael DiBattista | 2003-06-17 |
| 6519744 | Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane | Steven G. Seidel, Travis Eiles, Stefan Rusu, Dean J. Grannes | 2003-02-11 |
| 6501597 | Optical amplifier using wavelength converter | Donald A. Pitt, Keith A. Sigg, Jing Tian | 2002-12-31 |
| 6355494 | Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing | Richard H. Livengood, Paul Winer, Michael DiBattista | 2002-03-12 |