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Apparatus and method for compressive imaging and sensing through multiplexed modulation via spinning disks |
Kevin F. Kelly, Richard G. Baraniuk, Ting Sun, Matthew Turner |
2016-12-13 |
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Apparatus and method for compressive imaging and sensing through multiplexed modulation |
Kevin F. Kelly, Richard G. Baraniuk, Ting Sun, Matthew Turner |
2015-09-01 |
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Adaptively filtering compressive imaging measurements to attenuate noise |
James Merton Tidman |
2014-05-06 |
| 8634009 |
Dynamic range optimization in a compressive imaging system |
Kevin F. Kelly, Lenore McMackin, Robert F. Bridge, James Merton Tidman, Donna E. Hewitt |
2014-01-21 |
| 8451009 |
Techniques employing light-emitting circuits |
Martin Villafana, Michael DiBattista |
2013-05-28 |
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System and method for voltage noise and jitter measurement using time-resolved emission |
Steven Kasapi |
2010-03-16 |
| 7616312 |
Apparatus and method for probing integrated circuits using laser illumination |
Steven Kasapi, Kenneth Wilsher, William Lo, Radu Ispasoiu, Nagamani Nataraj +1 more |
2009-11-10 |
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Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system |
Steven Kasapi, Kenneth Wilsher |
2008-11-11 |
| 7243039 |
System and method for determining probing locations on IC |
Hitesh Suri |
2007-07-10 |
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Method and apparatus for controlling material removal from semiconductor substrate using induced current endpointing |
Richard H. Livengood, Paul Winer, Michael DiBattista |
2007-06-19 |
| 7012537 |
Apparatus and method for determining voltage using optical observation |
Steven Kasapi |
2006-03-14 |
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Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing |
Richard H. Livengood, Paul Winer, Michael DiBattista |
2004-08-24 |
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Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions |
Samie B. Samaan, Paul D. Madland |
2004-05-18 |
| 6596980 |
Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon counting |
Stefan Rusu, Harry Muljono, Jeremy Rowlette, Dean J. Grannes |
2003-07-22 |
| 6579732 |
Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing |
Richard H. Livengood, Paul Winer, Michael DiBattista |
2003-06-17 |
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Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane |
Steven G. Seidel, Travis Eiles, Stefan Rusu, Dean J. Grannes |
2003-02-11 |
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Optical amplifier using wavelength converter |
Donald A. Pitt, Keith A. Sigg, Jing Tian |
2002-12-31 |
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Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing |
Richard H. Livengood, Paul Winer, Michael DiBattista |
2002-03-12 |