| 11499817 |
Coordinate measuring machine with vision probe for performing points-from-focus type measurement operations |
— |
2022-11-15 |
| 10163601 |
Probe assembly with high bandwidth beam |
Amir Raveh, Evgeny Gregory NISENBOIM, Patrick Pardy |
2018-12-25 |
| 9651610 |
Visible laser probing for circuit debug and defect analysis |
Rajiv Giridharagopal, David Shykind |
2017-05-16 |
| 7660054 |
Thermally controlled sold immersion lens fixture |
Cameron Wagner, David Shykind |
2010-02-09 |
| 7410858 |
Isolation structure configurations for modifying stresses in semiconductor devices |
Qing Ma, Jin Lee, Harry Fujimoto, Changhong Dai, Shiuh-Wuu Lee +1 more |
2008-08-12 |
| 7411269 |
Isolation structure configurations for modifying stresses in semiconductor devices |
Qing Ma, Jin Lee, Harry Fujimoto, Changhong Dai, Shiuh-Wuu Lee +1 more |
2008-08-12 |
| 6882170 |
Device speed alteration by electron-hole pair injection and device heating |
Jeremy Rowlette |
2005-04-19 |
| 6876053 |
Isolation structure configurations for modifying stresses in semiconductor devices |
Qing Ma, Jin Lee, Harry Fujimoto, Changhong Dai, Shiuh-Wuu Lee +1 more |
2005-04-05 |
| 6607928 |
Integrated circuit device having an embedded heat slug |
Mario Paniccia |
2003-08-19 |
| 6570247 |
Integrated circuit device having an embedded heat slug |
Mario Paniccia |
2003-05-27 |
| 6519744 |
Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane |
Steven G. Seidel, Gary Woods, Stefan Rusu, Dean J. Grannes |
2003-02-11 |
| 5907464 |
MOSFET-based power supply clamps for electrostatic discharge protection of integrated circuits |
Timothy J. Maloney |
1999-05-25 |