| 9915700 |
System and method for modulation mapping |
— |
2018-03-13 |
|
| 9239357 |
System and method for modulation mapping |
— |
2016-01-19 |
|
| 8686748 |
System and method for modulation mapping |
— |
2014-04-01 |
|
| 7990167 |
System and method for modulation mapping |
— |
2011-08-02 |
|
| 7733100 |
System and method for modulation mapping |
— |
2010-06-08 |
|
| 7679358 |
System and method for voltage noise and jitter measurement using time-resolved emission |
Gary Woods |
2010-03-16 |
|
| 7616312 |
Apparatus and method for probing integrated circuits using laser illumination |
Kenneth Wilsher, Gary Woods, William Lo, Radu Ispasoiu, Nagamani Nataraj +1 more |
2009-11-10 |
|
| 7478345 |
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits |
— |
2009-01-13 |
|
| 7450245 |
Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system |
Gary Woods, Kenneth Wilsher |
2008-11-11 |
|
| 7439730 |
Apparatus and method for detecting photon emissions from transistors |
Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu |
2008-10-21 |
|
| 7323862 |
Apparatus and method for detecting photon emissions from transistors |
Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu |
2008-01-29 |
$2,130,000 |
| 7227580 |
Knife edge tracking system and method |
Amit Nabarro, Ofir Baharav |
2007-06-05 |
$1,719,000 |
| 7049593 |
Superconducting single photon detector |
Roman Sobolewski, Grigory N. Gol'tsman, Alexey D. Semenov, Oleg V. Okunev, Kenneth Wilsher |
2006-05-23 |
$6,417,000 |
| 7042563 |
Optical coupling for testing integrated circuits |
Kenneth Wilsher |
2006-05-09 |
$1,755,000 |
| 7038442 |
Apparatus and method for detecting photon emissions from transistors |
Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu |
2006-05-02 |
$2,482,000 |
| 7012537 |
Apparatus and method for determining voltage using optical observation |
Gary Woods |
2006-03-14 |
$7,509,000 |
| 6985219 |
Optical coupling for testing integrated circuits |
Kenneth Wilsher |
2006-01-10 |
$4,705,000 |
| 6976234 |
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits |
— |
2005-12-13 |
$7,332,000 |
| 6961672 |
Universal diagnostic platform for specimen analysis |
— |
2005-11-01 |
$8,863,000 |
| 6956365 |
System and method for calibration of testing equipment using device photoemission |
Israel Niv |
2005-10-18 |
$4,163,000 |
| 6891363 |
Apparatus and method for detecting photon emissions from transistors |
Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu |
2005-05-10 |
$6,084,000 |
| 6859031 |
Apparatus and method for dynamic diagnostic testing of integrated circuits |
Nader Pakdaman, Itzik Goldberger |
2005-02-22 |
$4,620,000 |
| 6836131 |
Spray cooling and transparent cooling plate thermal management system |
Tahir Cader, Nathan Stoddard, Donald E. Tilton, Nader Pakdaman |
2004-12-28 |
$3,058,000 |
| 6812464 |
Superconducting single photon detector |
Roman Sobolewski, Grigory N. Gol'tsman, Alexey D. Semenov, Oleg V. Okunev, Kenneth Wilsher |
2004-11-02 |
$7,449,000 |
| 6252222 |
Differential pulsed laser beam probing of integrated circuits |
Chun-Cheng Tsao, Seema Somani |
2001-06-26 |
$54,014,000 |
