Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9915700 | System and method for modulation mapping | — | 2018-03-13 |
| 9239357 | System and method for modulation mapping | — | 2016-01-19 |
| 8686748 | System and method for modulation mapping | — | 2014-04-01 |
| 7990167 | System and method for modulation mapping | — | 2011-08-02 |
| 7733100 | System and method for modulation mapping | — | 2010-06-08 |
| 7679358 | System and method for voltage noise and jitter measurement using time-resolved emission | Gary Woods | 2010-03-16 |
| 7616312 | Apparatus and method for probing integrated circuits using laser illumination | Kenneth Wilsher, Gary Woods, William Lo, Radu Ispasoiu, Nagamani Nataraj +1 more | 2009-11-10 |
| 7478345 | Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits | — | 2009-01-13 |
| 7450245 | Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system | Gary Woods, Kenneth Wilsher | 2008-11-11 |
| 7439730 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu | 2008-10-21 |
| 7323862 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu | 2008-01-29 |
| 7227580 | Knife edge tracking system and method | Amit Nabarro, Ofir Baharav | 2007-06-05 |
| 7049593 | Superconducting single photon detector | Roman Sobolewski, Grigory N. Gol'tsman, Alexey D. Semenov, Oleg V. Okunev, Kenneth Wilsher | 2006-05-23 |
| 7042563 | Optical coupling for testing integrated circuits | Kenneth Wilsher | 2006-05-09 |
| 7038442 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu | 2006-05-02 |
| 7012537 | Apparatus and method for determining voltage using optical observation | Gary Woods | 2006-03-14 |
| 6985219 | Optical coupling for testing integrated circuits | Kenneth Wilsher | 2006-01-10 |
| 6976234 | Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits | — | 2005-12-13 |
| 6961672 | Universal diagnostic platform for specimen analysis | — | 2005-11-01 |
| 6956365 | System and method for calibration of testing equipment using device photoemission | Israel Niv | 2005-10-18 |
| 6891363 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu | 2005-05-10 |
| 6859031 | Apparatus and method for dynamic diagnostic testing of integrated circuits | Nader Pakdaman, Itzik Goldberger | 2005-02-22 |
| 6836131 | Spray cooling and transparent cooling plate thermal management system | Tahir Cader, Nathan Stoddard, Donald E. Tilton, Nader Pakdaman | 2004-12-28 |
| 6812464 | Superconducting single photon detector | Roman Sobolewski, Grigory N. Gol'tsman, Alexey D. Semenov, Oleg V. Okunev, Kenneth Wilsher | 2004-11-02 |
| 6252222 | Differential pulsed laser beam probing of integrated circuits | Chun-Cheng Tsao, Seema Somani | 2001-06-26 |