Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10388148 | Method of controlling a calculation device via a mobile element and control system implementing this method | Jean-Louis Lopez | 2019-08-20 |
| 8555728 | Method and installation for exposing the surface of an integrated circuit | Michaël Obein | 2013-10-15 |
| 8344538 | Wind-powered device for producing electrical energy | Frederic Fevrier | 2013-01-01 |
| 8326558 | Method of analyzing an integrated circuit, method of observation and their associated installations | Kevin Sanchez | 2012-12-04 |
| 7692151 | Device for analyzing an integrated circuit | — | 2010-04-06 |
| 7560940 | Method and installation for analyzing an integrated circuit | Kevin Sanchez, Felix Beaudoin | 2009-07-14 |
| 7439730 | Apparatus and method for detecting photon emissions from transistors | Patricia Le Coupanec, William Lo, Philippe Perdu, Steven Kasapi | 2008-10-21 |
| 7417424 | Magnetic-field-measuring device | Olivier Crepel, Felix Beaudoin, Philippe Perdu | 2008-08-26 |
| 7411391 | Magnetic-field-measuring probe | Olivier Crepel, Felix Beaudoin, Philippe Perdu | 2008-08-12 |
| 7408342 | Device for measuring a component of current based on magnetic fields | Olivier Crepel, Felix Beaudoin, Philippe Perdu | 2008-08-05 |
| 7400154 | Apparatus and method for detecting photon emissions from transistors | Philippe Perdu, Ketan Shah, Theodore Lundquist | 2008-07-15 |
| 7323862 | Apparatus and method for detecting photon emissions from transistors | Patricia Le Coupanec, William Lo, Philippe Perdu, Steven Kasapi | 2008-01-29 |
| 7190822 | Method for customizing an integrated circuit element | Philippe Perdu | 2007-03-13 |
| 7038442 | Apparatus and method for detecting photon emissions from transistors | Patricia Le Coupanec, William Lo, Philippe Perdu, Steven Kasapi | 2006-05-02 |
| 6970759 | Method and device for automatic optimal location of an operation on an integrated circuit | Bruno Benteo | 2005-11-29 |
| 6967491 | Spatial and temporal selective laser assisted fault localization | Philippe Perdu, Felix Beaudoin, Praveen Vedagarbha, Martin Leibowitz, Kenneth Wilsher | 2005-11-22 |
| 6948107 | Method and installation for fast fault localization in an integrated circuit | Philippe Perdu | 2005-09-20 |
| 6943572 | Apparatus and method for detecting photon emissions from transistors | Philippe Perdu, Ketan Shah, Theodore Lundquist | 2005-09-13 |
| 6891363 | Apparatus and method for detecting photon emissions from transistors | Patricia Le Coupanec, William Lo, Philippe Perdu, Steven Kasapi | 2005-05-10 |
| 6844625 | Method for producing input/output permutation of several conductive strips with parallel branches of an integrated circuit and resulting circuit | Bruno Benteo | 2005-01-18 |
| 6816614 | Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip | Philippe Perdu | 2004-11-09 |
| 6552341 | Installation and method for microscopic observation of a semiconductor electronic circuit | Bruno Benteo | 2003-04-22 |
| 6526546 | Method for locating faulty elements in an integrated circuit | Guy Rolland | 2003-02-25 |