Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7439730 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Patricia Le Coupanec, William Lo, Steven Kasapi | 2008-10-21 |
| 7417424 | Magnetic-field-measuring device | Romain Desplats, Olivier Crepel, Felix Beaudoin | 2008-08-26 |
| 7411391 | Magnetic-field-measuring probe | Romain Desplats, Olivier Crepel, Felix Beaudoin | 2008-08-12 |
| 7408342 | Device for measuring a component of current based on magnetic fields | Romain Desplats, Olivier Crepel, Felix Beaudoin | 2008-08-05 |
| 7400154 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Ketan Shah, Theodore Lundquist | 2008-07-15 |
| 7323862 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Patricia Le Coupanec, William Lo, Steven Kasapi | 2008-01-29 |
| 7190822 | Method for customizing an integrated circuit element | Romain Desplats | 2007-03-13 |
| 7038442 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Patricia Le Coupanec, William Lo, Steven Kasapi | 2006-05-02 |
| 6967491 | Spatial and temporal selective laser assisted fault localization | Romain Desplats, Felix Beaudoin, Praveen Vedagarbha, Martin Leibowitz, Kenneth Wilsher | 2005-11-22 |
| 6948107 | Method and installation for fast fault localization in an integrated circuit | Romain Desplats | 2005-09-20 |
| 6943572 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Ketan Shah, Theodore Lundquist | 2005-09-13 |
| 6891363 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Patricia Le Coupanec, William Lo, Steven Kasapi | 2005-05-10 |
| 6816614 | Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip | Romain Desplats | 2004-11-09 |