Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Universal diagnostic platform for specimen analysis

Universal diagnostic platform for specimen analysis

US Patent 6961672 · Granted Nov 1, 2005

Estimated economic value: $8,863,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for modulation mapping2018
System and method for modulation mapping2016
System and method for modulation mapping2014
System and method for modulation mapping2011
System and method for modulation mapping2010
System and method for voltage noise and jitter measurement using time-resolved e2010
Apparatus and method for probing integrated circuits using laser illumination2009
Apparatus and method for measuring characteristics of dynamic electrical signals2009
Method and apparatus for measuring high-bandwidth electrical signals using modul2008
Apparatus and method for detecting photon emissions from transistors2008
Apparatus and method for detecting photon emissions from transistors2008
Knife edge tracking system and method2007