| 8990759 |
Contactless technique for evaluating a fabrication of a wafer |
Majid Aghababazadeh, Jose J. Estabil, Gary Steinbrueck |
2015-03-24 |
| 8410568 |
Integrated photodiode for semiconductor substrates |
Gary Steinbrueck, James S. Vickers, Mario M. Pelella, Majid Aghababazadeh |
2013-04-02 |
| 8344745 |
Test structures for evaluating a fabrication of a die or a wafer |
Majid Aghababazadeh, Jose J. Estabil, Gary Steinbrueck, James S. Vickers |
2013-01-01 |
| 7736916 |
System and apparatus for using test structures inside of a chip during the fabrication of the chip |
Majid Aghababazadeh, Jose J. Estabil, Gary Steinbrueck, James S. Vickers |
2010-06-15 |
| 7730434 |
Contactless technique for evaluating a fabrication of a wafer |
Majid Aghababazadeh, Jose J. Estabil, Gary Steinbrueck |
2010-06-01 |
| 7723724 |
System for using test structures to evaluate a fabrication of a wafer |
Majid Aghababazadeh, Jose J. Estabil, Gary Steinbrueck, James S. Vickers |
2010-05-25 |
| 7605597 |
Intra-chip power and test signal generation for use with test structures on wafers |
Majid Aghababazadeh, Jose J. Estabil, Gary Steinbrueck, James S. Vickers |
2009-10-20 |
| 7492529 |
Bi-convex solid immersion lens |
James S. Vickers |
2009-02-17 |
| 7466852 |
Time resolved non-invasive diagnostics system |
Daniel Cotton, James S. Vickers, Thomas Wong |
2008-12-16 |
| 7423288 |
Technique for evaluating a fabrication of a die and wafer |
Majid Aghababazadeh, Jose J. Estabil, Gary Steinbrueck, James S. Vickers |
2008-09-09 |
| 7339388 |
Intra-clip power and test signal generation for use with test structures on wafers |
Majid Aghababazadeh, Jose J. Estabil, Gary Steinbrueck, James S. Vickers |
2008-03-04 |
| 7256055 |
System and apparatus for using test structures inside of a chip during the fabrication of the chip |
Majid Aghababazadeh, Jose J. Estabil, Gary Steinbrueck, James S. Vickers |
2007-08-14 |
| 7227702 |
Bi-convex solid immersion lens |
James S. Vickers |
2007-06-05 |
| 7224828 |
Time resolved non-invasive diagnostics system |
Daniel Cotton, James S. Vickers, Thomas Wong |
2007-05-29 |
| 7220990 |
Technique for evaluating a fabrication of a die and wafer |
Majid Aghababazadeh, Jose J. Estabil, Gary Steinbrueck, James S. Vickers |
2007-05-22 |
| 6859031 |
Apparatus and method for dynamic diagnostic testing of integrated circuits |
Steven Kasapi, Itzik Goldberger |
2005-02-22 |
| 6836131 |
Spray cooling and transparent cooling plate thermal management system |
Tahir Cader, Nathan Stoddard, Donald E. Tilton, Steven Kasapi |
2004-12-28 |
| 6778327 |
Bi-convex solid immersion lens |
James S. Vickers |
2004-08-17 |
| 6621275 |
Time resolved non-invasive diagnostics system |
Daniel Cotton, James S. Vickers, Thomas Wong |
2003-09-16 |
| 6594086 |
Bi-convex solid immersion lens |
James S. Vickers |
2003-07-15 |