Issued Patents All Time
Showing 25 most recent of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11605525 | System and method of preparing integrated circuits for backside probing using charged particle beams | Seema Somani, Cecelia Campochiaro, Yakov Bobrov | 2023-03-14 |
| 11353479 | Laser-assisted device alteration using synchronized laser pulses | Praveen Vedagarbha, Derryck Reid, Keith Serrels | 2022-06-07 |
| 10209274 | Laser-assisted device alteration using synchronized laser pulses | Praveen Vedagarbha, Derryck Reid, Keith Serrels | 2019-02-19 |
| 10126360 | Systems and method for laser voltage imaging | — | 2018-11-13 |
| 9361533 | Apparatus and method for polarization diversity imaging and alignment | Keith Serrels, Prasad Sabbineni | 2016-06-07 |
| 9201096 | Laser-assisted device alteration using synchronized laser pulses | Praveen Vedagarbha, Derryck Reid, Keith Serrels | 2015-12-01 |
| 8872297 | Integrated photodiode for semiconductor substrates | Gary Steinbrueck, Mario M. Pelella, Majid Aghababazadeh, Nadar Pakdaman | 2014-10-28 |
| 8410568 | Integrated photodiode for semiconductor substrates | Gary Steinbrueck, Mario M. Pelella, Majid Aghababazadeh, Nader Pakdaman | 2013-04-02 |
| 8344745 | Test structures for evaluating a fabrication of a die or a wafer | Majid Aghababazadeh, Jose J. Estabil, Nader Pakdaman, Gary Steinbrueck | 2013-01-01 |
| 7736916 | System and apparatus for using test structures inside of a chip during the fabrication of the chip | Majid Aghababazadeh, Jose J. Estabil, Nader Pakdaman, Gary Steinbrueck | 2010-06-15 |
| 7723724 | System for using test structures to evaluate a fabrication of a wafer | Majid Aghababazadeh, Jose J. Estabil, Nader Pakdaman, Gary Steinbrueck | 2010-05-25 |
| 7605597 | Intra-chip power and test signal generation for use with test structures on wafers | Majid Aghababazadeh, Jose J. Estabil, Nader Pakdaman, Gary Steinbrueck | 2009-10-20 |
| 7492529 | Bi-convex solid immersion lens | Nader Pakdaman | 2009-02-17 |
| 7466852 | Time resolved non-invasive diagnostics system | Daniel Cotton, Nader Pakdaman, Thomas Wong | 2008-12-16 |
| 7423288 | Technique for evaluating a fabrication of a die and wafer | Majid Aghababazadeh, Jose J. Estabil, Nader Pakdaman, Gary Steinbrueck | 2008-09-09 |
| 7339388 | Intra-clip power and test signal generation for use with test structures on wafers | Majid Aghababazadeh, Jose J. Estabil, Nader Pakdaman, Gary Steinbrueck | 2008-03-04 |
| 7256055 | System and apparatus for using test structures inside of a chip during the fabrication of the chip | Majid Aghababazadeh, Jose J. Estabil, Nader Pakdaman, Gary Steinbrueck | 2007-08-14 |
| 7227702 | Bi-convex solid immersion lens | Nader Pakdaman | 2007-06-05 |
| 7224828 | Time resolved non-invasive diagnostics system | Daniel Cotton, Nader Pakdaman, Thomas Wong | 2007-05-29 |
| 7220990 | Technique for evaluating a fabrication of a die and wafer | Majid Aghababazadeh, Jose J. Estabil, Nader Pakdaman, Gary Steinbrueck | 2007-05-22 |
| 7009173 | Lens mount integrated with a thermoelectrically cooled photodetector module | Radu Ispasoiu, Thomas R. Gockel | 2006-03-07 |
| 6797581 | Avalanche photodiode for photon counting applications and method thereof | — | 2004-09-28 |
| 6778327 | Bi-convex solid immersion lens | Nader Pakdaman | 2004-08-17 |
| 6720588 | Avalanche photodiode for photon counting applications and method thereof | — | 2004-04-13 |
| 6621275 | Time resolved non-invasive diagnostics system | Daniel Cotton, Nader Pakdaman, Thomas Wong | 2003-09-16 |